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The First Computer: Digital Electronics

Moore's Law predicts that semiconductor technology will double its effectiveness every 18 months. The number of transistors on a chip doubles every 18 to 24 months. Power will be a major problem 100000 10000 Power Density 10000 Power Density 10000 power (W / cm2)
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0% found this document useful (0 votes)
74 views10 pages

The First Computer: Digital Electronics

Moore's Law predicts that semiconductor technology will double its effectiveness every 18 months. The number of transistors on a chip doubles every 18 to 24 months. Power will be a major problem 100000 10000 Power Density 10000 Power Density 10000 power (W / cm2)
Copyright
© Attribution Non-Commercial (BY-NC)
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd
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07/02/2013

The First Computer

Introduction
Digital Electronics
The Babbage Difference Engine (1832) 25,000 parts cost: 17,470
2

ENIAC - The first electronic computer (1946)

Copyright 2005 Pearson Addison-Wesley. All rights reserved.

1-4

07/02/2013

The First Integrated Circuits


Bipolar logic 1960s

ECL 3-input Gate Motorola 1966


Copyright 2005 Pearson Addison-Wesley. All rights reserved.

1-5

Intel 4004 Micro-Processor


1971 1000 transistors 1 MHz operation

Intel Pentium (IV) microprocessor

07/02/2013

Moores Law
In 1965, Gordon Moore noted that the number of transistors on a chip doubled every 18 to 24 months. He made a prediction that semiconductor technology will double its effectiveness every 18 months
16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
LOG2 OF THE NUMBER OF COMPONENTS PER INTEGRATED FUNCTION

Moores Law

1959

1960

1961

1962

1963

1964

1965

1966

1967

1968

1969

1970

1971

1972

1973

1974

Electronics, April 19, 1965.


9 10

Evolution in Complexity
K 1,000,000 100,000 10,000 1,000 100 10 1 1975

Transistor Counts
1 Billion Transistors

i486 i386 80286 8086

Pentium III Pentium II Pentium Pro Pentium

1980

1985 1990

1995 2000
Projected

2005 2010

11

12

Courtesy, Intel

1975

Source: Intel

07/02/2013

Moores law in Microprocessors


100 1000

Die Size Growth

Die size (mm)

100

2X growth in 1.96 years!


P6 Pentium proc 10 8080 8008 4004 1 1970 1990 Year 2000 2010 1980 1990 Year 2000 2010 8086 8085 286 386 P6 486 Pentium proc

Transistors (MT)

10 1 0.1 0.01 8086 8085 8080 8008 4004 1980 386 286 486

~7% growth per year ~2X growth in 10 years

0.001

1970

Die size grows by 14% to satisfy Moores Law

Transistors on Lead Microprocessors double every 2 years


13

Courtesy, Intel

14

Courtesy, Intel

Frequency
10000 1000 Doubles every 2 years 100

Power Dissipation
P6 Pentium proc

Frequency (Mhz)

Power (Watts)

100 486 10 1 0.1 1970 8085 8086 286 386

P6 Pentium proc

10 8086 286 1 4004 8085 8080 486 386

8008

8080 8008 4004 1980 1990 Year 2000 2010

0.1 1971 1974 1978 Year 1985 1992 2000

Lead Microprocessors frequency doubles every 2 years

Lead Microprocessors power continues to increase

15

Courtesy, Intel

16

Courtesy, Intel

07/02/2013

Power will be a major problem


100000 10000

Power density
10000

Power Density (W/cm2)

Power (Watts)

1000 100 10 Pentium proc

18KW 5KW 1.5KW 500W

1000

Rocket Nozzle Nuclear Reactor

286 8086 386 486 8085 8080 8008 1 4004

100

0.1 1971 1974 1978 1985 1992 Year 2000 2004 2008

8086 10 4004 Hot Plate P6 8008 8085 Pentium proc 386 286 486 8080 1 1970 1980 1990 2000 Year

2010

Power delivery and dissipation will be prohibitive

Power density too high to keep junctions at low temp


18

17

Courtesy, Intel

Courtesy, Intel

Not Only Microprocessors


Cell Phone

Challenges in Digital Design


DSM 1/DSM
Macroscopic Issues
Time-to-Market Millions of Gates High-Level Abstractions Reuse & IP: Portability Predictability etc.

Small Signal RF

Microscopic Problems
Power RF

Digital Cellular Market (Phones Shipped)

Power Management

1996 1997 1998 1999 2000


Units

48M 86M 162M 260M 435M

Analog Baseband
Digital Baseband (DSP + MCU)

Ultra-high speed design Interconnect Noise, Crosstalk Reliability, Manufacturability Power Dissipation Clock distribution. Everything Looks a Little Different

(data from Texas Instruments)


19 20

and Theres a Lot of Them!

07/02/2013

Why Scaling?
Technology shrinks by 0.7/generation With every generation can integrate 2x more functions per chip; chip cost does not increase significantly Cost of a function decreases by 2x But
How to design chips with more and more functions? Design engineering population does not double every two years

Design Abstraction Levels


SYSTEM

MODULE + GATE

CIRCUIT

DEVICE G S n+ D n+

Hence, a need for more efficient design methods


Exploit different levels of abstraction
21 22

Why?
Why should we be concerned with digital circuit design at all?
Some one still has to design and implement the module libraries
Approximately every two years requires a redesign of the library

Why?
Why should we be concerned with digital circuit design at all?
Creating an adequate model of a cell or module requires an in-depth understanding of its internal operation
Identify the dominant performance parameters of a given design Recognize the critical timing path

07/02/2013

Why?
Why should we be concerned with digital circuit design at all?
Library-based approach works fine when the design constrains (speed, cost, or power) are not stringent. At High performance, designers tend to push technology to its limits Hierarchical approach tends to become less attractive

Why?
Why should we be concerned with digital circuit design at all?
The performance of, for instance, an adder can be substantially influenced by the way it is connected to its environment.
Interconnect parasitics

Customize

Why?
Why should we be concerned with digital circuit design at all?
Scaling tends to emphasize some other deficiencies.
Clock signals for synchronization and supply lines
Connecting more cells to a supply line can cause a voltage drop over the wire.

Why?
Why should we be concerned with digital circuit design at all?
New design issues
One must be able to model and analyze their impact into circuit topology and behavior.

A fabricated circuit does not always exhibit the exact waveforms one might expect from advance simulators
Deviations can be caused by variations in the fabrication

07/02/2013

Fundamental Design Metrics


Functionality Cost
NRE (fixed) costs - design effort RE (variable) costs - cost of parts, assembly, test

Cost of Integrated Circuits


NRE (non-recurring engineering) costs
Fixed cost to produce the design
design effort design verification effort mask generation

Reliability, robustness
Noise margins Noise immunity

Influenced by the design complexity and designer productivity More pronounced for small volume products

Recurring costs proportional to product volume


silicon processing
also proportional to chip area

Performance
Speed (delay) Power consumption; energy

Time-to-market

assembly (packaging) test


fixed cost cost per IC = variable cost per IC + ----------------volume

NRE Cost is Increasing

Silicon Wafer
Single die

Wafer

From http://www.amd.com

07/02/2013

Recurring Costs
cost of die + cost of die test + cost of packaging variable cost = ---------------------------------------------------------------final test yield cost of wafer cost of die = ----------------------------------dies per wafer die yield
(wafer diameter/2)2 wafer diameter dies per wafer = ---------------------------------- --------------------------die area 2 die area

Yield Example
Example
wafer size of 12 inches, die size of 2.5 cm2, 1 defects/cm2, (measure of manufacturing process complexity) 252 dies/wafer (remember, wafers round & dies square) die yield of 16% 252 x 16% = only 40 dies/wafer die yield ! =3

Die cost is strong function of die area


proportional to the third or fourth power of the die area

die yield

= (1 + (defects per unit area die area)/)-

Examples of Cost Metrics (1994)


Chip 386DX 486DX2 PowerPC 601 HP PA 7100 DEC Alpha Super SPARC Pentium Metal layers 2 3 4 3 3 3 3 Line Wafer Defects Area Dies/ Yield Die width cost /cm2 (mm2) wafer cost 0.90 $900 1.0 43 360 71% $4 0.80 $1200 1.0 81 181 54% $12 0.80 $1700 1.3 121 115 28% $53 0.80 0.70 0.70 0.80 $1300 $1500 $1700 $1500 1.0 1.2 1.6 1.5 196 234 256 296 66 53 48 40 27% $73

Reliability
Noise in Digital Integrated Circuits

Noise unwanted variations of voltages and currents at the logic nodes


from two wires placed side by side
capacitive coupling
- voltage change on one wire can influence signal on the neighboring wire - cross talk
v(t)

19% $149 13% $272 9% $417

inductive coupling
- current change on one wire can influence signal on the neighboring wire

i(t)

VDD

from noise on the power and ground supply rails


can influence signal levels in the gate

07/02/2013

Example of Capacitive Coupling


Signal wire glitches as large as 80% of the supply voltage will be common due to crosstalk between neighboring wires as feature sizes continue to scale
Crosstalk vs. Technology
Pulsed Signal 0.12m CMOS 0.16m CMOS

Black line quiet Red lines pulsed Glitches strength vs technology 0.25m CMOS 0.35m CMOS

From Dunlop, Lucent, 2000

10

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