DEPARTMENT OF ENGINEERING
System Test Engineering (MSc)
Course fee: 727 euros per semester
S. No. Course
Quality and Reliability Testing | Lecture (Vo) | Course Code: 200862205
Quality and Reliability Testing
• Quality and reliability: definition, assessment, indicators and planning
• System and component qualification
• ESD and latch up effect
1. • EMC control
• High and low temperature operating limits (HTOL/LTOL),
• Highly accelerated stress test (HAST)
• High temperature storage life (HTSL)
• Temperature humidity bias (THB)
System Requirements and Testing | Integrated course (iL) | Course Code: 200862105
System Requirements and Testing
• Fundamentals of mechatronic systems
• Structural vs. application testing
• V-model for mechatronic systems
• Requirements management and testing
• System test strategies (test planning, test methods, test cases)
2.
• Compliance matrix
• Model-based development
• Functional testing
• Hardware-in-the-loop
• Software-in-the-loop
• Model-in-the-loop
PCB Design for Testing | Integrated course (iL) | Course Code: 200862204
PCB Design for Testing
• EMC-aware PCB design
• Shielding and guarding
• Crosstalk and parasitic effects
• Controlled impedance routing
3. • Power integrity
• Impedance adjustment
• Test structures for PCB design
• Contacting (test socket, needle cards, plug connections)
• Assembly and component selection
• Analysis of good and bad examples of PCB layout
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Semiconductor Testing | Integrated course (iL) | Coursecode: 200862305
Design for Test
• Definition of terms
• Testing of semiconductors (application example)
• Controllability, observability, accessibility of circuits
• Modularization and testing
4. • Test modes
• Parallel tests
• Life time management: wafer test, backend test, test of product returns (fi eld tests)
• Structural testing (White Box, Grey Box, Black Box)
• Application/functional testing
• Testing of digital circuits (scan test, JTAG, built-in self-tests)
• Testing mixed-signal circuits (built-in self-tests, IEEE 1149.4)
Semiconductor Testing | Integrated course (iL) | Course Code: 200862307
Production Testing
• Processes in electronic production and chip fabrication
• Test program development and debugging
• Remote debugging and remote development
• Compliance matrix
• Methods for test time optimization
•Test flow, test insertions
• Guard band (test-limit management)
5.
PAT (part average testing)
PCB with test adapter
• Test equipment overview and architecture
• Binning and Grading
• Data Logging
• Wafer test and package test
• ATE programming
• Traceability
• Trimming and fusing
Software Testing | Integrated course (iL) | Course Code: 200862202
Software Testing
• Software development lifecycle
• Fundamental concepts in software testing
• Testing throughout the software lifecycle
• Static and dynamic testing strategies
6. • Test design and management
• Testing strategies for soft ware
• Regression test, module test and integration test
• Tools support for testing
• Firmware testing
• Versioning and documentation
Semiconductor Testing | Integrated course (iL) | Course Code: 200862306
Verification and Validation Testing
• Validation and production test
• Preparing a verification plan
7. • Automatic test vector generation (ATVG)
• Structural, block and system test
• Automated test
• Characterization, comparison with data sheet, Corner Testing
• Robustness validation
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Mathematical Methods in Test Engineering | Integrated course (iL) | Course Code: 200862101
Mathematical Methods in Test Engineering
• Frequency distributions and visualizing data
• Describing data by central tendency and variability
• Probability and the normal distribution
8.
• Sampling distributions
• Estimation and hypothesis testing
• Correlation and linear regression
• T-tests, chi-squared tests and analysis of variance (ANOVA)
• Case studies of domain specific examples (e.g. test coverage, fault simulation)
Test and Measurement Automation Laboratory | Integrated course (iL) | Course Code: 200862203
Test and Measurement Automation Laboratory
• Building automated test systems based on a complex example including software,
measurement/testing equipment and hardware(sensors, PCB)
9. • Selection of hardware and software based on test cases and their measurement
requirements
• Implementation and automation of test systems
• Test documentation and version control
• Measurement system analysis (MSA)
Test Standards | Lecture (Vo) | Course Code: 200862206
Test Standards
Verifying designs and testing printed circuit boards according to the JTAG standard
10. • Functional safety according to ISO 26262
• Quality standards such as IATF 16949
• Overview of EMC standards
• Statistical test methods and the ISO 2859 standard
System Testing | Integrated course (iL) | Course Code: 200862308
Machine Learning and Optimization for Testing
• Optimization algorithms (heuristic methods, interactive methods)
• Machine learning (supervised and unsupervised)
11. • Annotation of data, detection rate and over-fitting
• Types of neural networks
• Learning of neural networks
• Verifying the performance of neural networks using test data
• Improving the performance of neural networks
System Testing | Integrated course (iL) | Course Code: 200862309
Testing of Mechatronic Systems
• Introduction to mechatronic systems of different complexity
• Functional relationship between the overall system and the subsystems involved
12.
• Validation environments for mechatronic systems (MIL, SIL, HIL, test bench)
• Development and validation of models of subsystems
• Correlation between real-world tests and model-based tests
• Efficient allocation of the necessary validation tests to different test environments
System Testing | Integrated course (iL) | Course Code: 200862310
Testing of Automotive Systems
• Test platforms in the automotive industry (lab vehicle, subsystems, overall vehicle
tests)
• Electrical safety (HV tests on systems and the overall vehicle)
13. • ESD and EMC testing
• Sensor stimulation or sensor simulation for the VIL
• Case example from the automotive industry
• Levels of automated driving according to SAE
• Advanced driver assistance systems (ADAS) and autonomous driving (AD)
• Scenario-based validation of ADAS/AD
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Security and Testing | Integrated course (iL) | Course Code: 200862301
Security and Testing
• Fundamentals of information security
14. • Software methods for information security (e.g. encryption, certificates)
• Hardware methods for information security (e.g. side-channel attacks and
countermeasures)
• Examples of successful security attacks and possible solutions
Technical Documentation | Seminar (Se) | Course Code: 200862303
Technical Documentation
• Terminology in engineering and information technology
• Target group oriented writing
15.
• Readability and comprehensibility
• Design, typography, layout, information graphics, technical illustration
• Test specification, failure tracking and customer-specific reports
• Standardization of format and language through the use of templates and standards
Digital Electronics | Integrated course (iL) | Course Code: 200862103
16. Digital Electronics
Mixed-Signal Electronics | Integrated course (iL) | Course Code: 200862104
17. Mixed-Signal Electronics
Software Environments and Programming | Integrated course (iL) | Course Code: 200862102
18. Software Environments and Programming
Data Mining and Processing | Integrated course (iL) | Course Code: 200862201
19. Data Mining and Processing
Project | Project thesis (PT) | Course Code: 200862304
20. Project
Project Management | Seminar (Se) | Course Code: 200862302
21. Project Management
Intercultural Communication and Meetings | Seminar (Se) | Course Code: 200862401
22. Intercultural Communication and Meetings
Scientific Working | Master Thesis (MA) | Course Code: 200862403
23. Master's Thesis and Exam
Scientific Working | Seminar (Se) | Course Code: 200862402
24. Scientific Writing
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