F280023C Datasheet
F280023C Datasheet
An©IMPORTANT
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2020 Texas Instruments at the end of this data sheet addresses availability, warranty, changes, use in safety-critical
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intellectual property matters and other important disclaimers. PRODUCTION DATA.
Product Folder Links: TMS320F280025 TMS320F280025-Q1 TMS320F280025C TMS320F280025C-Q1
TMS320F280023 TMS320F280023-Q1 TMS320F280023C TMS320F280021 TMS320F280021-Q1
TMS320F280025, TMS320F280025-Q1
TMS320F280025C, TMS320F280025C-Q1, TMS320F280023, TMS320F280023-Q1
TMS320F280023C, TMS320F280021, TMS320F280021-Q1
SPRSP45B – MARCH 2020 – REVISED DECEMBER 2020 www.ti.com
3 Description
The TMS320F28002x (F28002x) is a member of the C2000™ real-time microcontroller family of scalable, ultra-
low latency devices designed for efficiency in power electronics, including but not limited to: high power density,
high switching frequencies, and supporting the use of GaN and SiC technologies.
These include such applications as:
• Industrial motor drives
• Motor control
• Solar inverters
• Digital power
• Electrical vehicles and transportation
• Sensing and signal processing
The real-time control subsystem is based on TI’s 32-bit C28x DSP core, which provides 100 MHz of signal-
processing performance for floating- or fixed-point code running from either on-chip flash or SRAM. The C28x
CPU is further boosted by the Trigonometric Math Unit (TMU) and VCRC (Cyclical Redundancy Check)
extended instruction sets, speeding up common algorithms key to real-time control systems.
High-performance analog blocks are integrated on the F28002x real-time microcontroller (MCU) and are closely
coupled with the processing and PWM units to provide optimal real-time signal chain performance. Fourteen
PWM channels, all supporting frequency-independent resolution modes, enable control of various power stages
from a 3-phase inverter to advanced multi-level power topologies.
The inclusion of the Configurable Logic Block (CLB) allows the user to add custom logic and potentially integrate
FPGA-like functions into the C2000 real-time MCU.
Interfacing is supported through various industry-standard communication ports (such as SPI, SCI, I2C, PMBus,
LIN, and CAN) and offers multiple pin-muxing options for optimal signal placement. The Fast Serial Interface
(FSI) enables up to 200 Mbps of robust communications across an isolation boundary.
New to the C2000 platform is the Host Interface Controller (HIC), a high-throughput interface that allows an
external host to access the resources of the TMS320F28002x directly.
Want to learn more about features that make C2000 MCUs the right choice for your real-time control system?
Check out The Essential Guide for Developing With C2000™ Real-Time Microcontrollers and visit the C2000™
real-time control MCUs page.
Ready to get started? Check out the TMDSCNCD280025C evaluation board and download C2000Ware.
Device Information
CONFIGURABLE LOGIC
PART NUMBER(1) FLASH SIZE
BLOCK (CLB)
TMS320F280025C 2 Tiles
128KB
TMS320F280025 –
TMS320F280023C 2 Tiles
64KB
TMS320F280023 –
TMS320F280021 – 32KB
(1) For more information on these devices, see the Device Comparison table.
14x ePWM Chan. 14x ePWM Chan. Result Data 1x PMBUS 1x CAN 2x LIN 1x SCI
4x CMPSS
(8 Hi-Res Capable) (8 Hi-Res Capable) 2x 12-Bit ADC 39x GPIO 2x SPI 2x I2C
3x eCAP 3x eCAP Input XBAR
2x CLB 1x FSI RX NMI
(1 HRCAP Capable) (1 HRCAP Capable)
Output XBAR 1x FSI TX Watchdog
2x eQEP
(CW/CCW Support) ePWM XBAR Windowed
Watchdog
CLB XBAR
Table of Contents
1 Features............................................................................1 8 Detailed Description....................................................153
2 Applications..................................................................... 2 8.1 Overview................................................................. 153
3 Description.......................................................................2 8.2 Functional Block Diagram....................................... 154
3.1 Functional Block Diagram........................................... 4 8.3 Memory................................................................... 155
4 Revision History.............................................................. 6 8.4 Identification............................................................160
5 Device Comparison......................................................... 9 8.5 Bus Architecture – Peripheral Connectivity.............161
5.1 Related Products...................................................... 10 8.6 C28x Processor...................................................... 162
6 Terminal Configuration and Functions........................ 11 8.7 Embedded Real-Time Analysis and Diagnostic
6.1 Pin Diagrams.............................................................11 (ERAD)...................................................................... 164
6.2 Pin Attributes.............................................................14 8.8 Background CRC-32 (BGCRC).............................. 164
6.3 Signal Descriptions................................................... 29 8.9 Direct Memory Access (DMA).................................165
6.4 Pin Multiplexing.........................................................39 8.10 Device Boot Modes...............................................166
6.5 Pins With Internal Pullup and Pulldown.................... 46 8.11 Dual Code Security Module.................................. 172
6.6 Connections for Unused Pins................................... 47 8.12 Watchdog.............................................................. 173
7 Specifications................................................................ 48 8.13 C28x Timers..........................................................174
7.1 Absolute Maximum Ratings ..................................... 48 8.14 Dual-Clock Comparator (DCC)............................. 174
7.2 ESD Ratings – Commercial...................................... 48 8.15 Configurable Logic Block (CLB)............................176
7.3 ESD Ratings – Automotive....................................... 49 9 Applications, Implementation, and Layout............... 178
7.4 Recommended Operating Conditions ......................49 9.1 TI Reference Design............................................... 178
Supply Voltages.............................................................. 50 10 Device and Documentation Support........................179
7.5 Power Consumption Summary................................. 51 10.1 Getting Started and Next Steps............................ 179
7.6 Electrical Characteristics ..........................................55 10.2 Device and Development Support Tool
7.7 Thermal Resistance Characteristics for PN Nomenclature............................................................ 179
Package...................................................................... 56 10.3 Markings............................................................... 180
7.8 Thermal Resistance Characteristics for PM 10.4 Tools and Software............................................... 182
Package...................................................................... 56 10.5 Documentation Support........................................ 183
7.9 Thermal Resistance Characteristics for PT 10.6 Support Resources............................................... 184
Package...................................................................... 57 10.7 Trademarks........................................................... 185
7.10 Thermal Design Considerations..............................57 10.8 Electrostatic Discharge Caution............................185
7.11 System.................................................................... 58 10.9 Glossary................................................................185
7.12 Analog Peripherals..................................................86 11 Mechanical, Packaging, and Orderable
7.13 Control Peripherals............................................... 106 Information.................................................................. 186
7.14 Communications Peripherals................................ 121 11.1 Packaging Information.......................................... 186
4 Revision History
Changes from October 4, 2020 to December 31, 2020 (from Revision A (October 2020) to
Revision B (December 2020)) Page
• Global: Added TMS320F280025-Q1, TMS320F280025C-Q1, TMS320F280023-Q1, and TMS320F280021-
Q1....................................................................................................................................................................... 1
• Table 5-1 (Device Comparison): Added TMS320F280025-Q1, TMS320F280025C-Q1, TMS320F280023-Q1,
and TMS320F280021-Q1. Updated table...........................................................................................................1
• Table 6-1 (Pin Attributes): Updated muxed signal names of A7. Updated DESCRIPTION of VDD: Changed
recommended total capacitance from 22 µF to 10 µF.......................................................................................11
• Removed Digital Signals by GPIO section (Section 6.3.2 in SPRSP45A)........................................................29
• Section 6.3.2 (Digital Signals): Added section..................................................................................................29
• Table 6-4 (Power and Ground): Updated DESCRIPTION of VDD: Changed recommended total capacitance
from 22 µF to 10 µF...........................................................................................................................................29
• Section 7.2 (ESD Ratings – Commercial): Updated device numbers...............................................................48
• Section 7.3 (ESD Ratings – Automotive): Updated device numbers. Added data for 64-pin PM package...... 49
• Section 7.5.1 (System Current Consumption): Updated table..........................................................................51
• Section 7.11.1.1 (Internal 1.2-V LDO Voltage Regulator (VREG)): Updated Configuration 1.......................... 58
• Section 7.11.3.5.1 (INTOSC Characteristics): Updated table........................................................................... 69
• Table 7-5 (Flash Parameters): Changed "Nwec Write/Erase Cycles" to "Nwec Write/Erase Cycles per sector".
Added "Nwec Write/Erase Cycles for entire Flash (combined all sectors)"........................................................70
• Section 7.14.8 (Host Interface Controller (HIC)): Updated "The HIC module allows ..." paragraph............... 149
• Figure 7-70 (HIC Block Diagram): Removed "Bus Master Interface" label.....................................................149
• Figure 10-1 (Device Nomenclature): Updated figure...................................................................................... 179
• Section 10.4 (Tools and Software): Added LAUNCHXL-F280025C to Development Tools section............. 182
Changes from March 17, 2020 to October 3, 2020 (from Revision * (March 2020) to Revision A
(October 2020)) Page
• Global: Updated the numbering format for tables, figures, and cross-references throughout the document.... 1
• Global: This document is now PRODUCTION DATA........................................................................................ 1
• Global: Removed TMS320F280024, TMS320F280024C, and TMS320F280022............................................. 1
• Global: Removed 64 QFP-Q data......................................................................................................................1
• Section 1 (Features): Updated Serial Communication Interface (SCI) feature. Updated Local Interconnect
Network (LIN) feature......................................................................................................................................... 1
• Table 5-1 (Device Comparison): Updated table..................................................................................................1
• Section 2 (Applications): Updated section.......................................................................................................... 2
• Section 3 (Description): Updated section........................................................................................................... 2
• Device Information: Updated table..................................................................................................................... 2
• Figure 3-1 (Functional Block Diagram): Updated figure..................................................................................... 4
• Table 6-1 (Pin Attributes): Updated table.......................................................................................................... 11
• Figure 6-2 (64-Pin PM Low-Profile Quad Flatpack (Top View)): Updated figure...............................................11
• Removed "64-Pin PM Low-Profile Quad Flatpack – Q-Temperature (Top View)" figure...................................11
• Removed Digital Signals section (Section 4.3.2 in SPRSP45).........................................................................29
• Digital Signals by GPIO: Added section........................................................................................................... 29
• Table 6-4 (Power and Ground): Updated DESCRIPTION of VDD and VDDIO................................................ 29
• Section 6.4.1.1 (GPIO Muxed Pins Table): Added Note about AIO pins.......................................................... 40
• Table 6-6 (GPIO Muxed Pins): Updated table.................................................................................................. 40
• Section 6.4.4 (GPIO Output X-BAR, CLB X-BAR, CLB Output X-BAR, and ePWM X-BAR): Changed section
title from "GPIO Output X-BAR and ePWM X-BAR" to "GPIO Output X-BAR, CLB X-BAR, CLB Output X-
BAR, and ePWM X-BAR". Updated section..................................................................................................... 44
• Figure 6-5 (Output X-BAR, CLB X-BAR, CLB Output X-BAR, and ePWM X-BAR Sources): Replaced "Output
X-BAR and ePWM X-BAR Sources" figure with "Output X-BAR, CLB X-BAR, CLB Output X-BAR, and ePWM
X-BAR Sources" figure..................................................................................................................................... 44
• Table 6-9 (Connections for Unused Pins): Added "Analog input pins" in ANALOG section............................. 47
• Section 7 (Specifications): Updated section and tables....................................................................................48
• Section 7.1 (Absolute Maximum Ratings): Updated table................................................................................ 48
• Section 7.4 (Recommended Operating Conditions): Updated SRSUPPLY values and unit................................ 48
• Section 7.6 (Electrical Characteristics): Updated ROH and ROL values............................................................ 48
• Section 7.3 (ESD Ratings – Automotive): Removed F280024, F280024C, and F280022 data....................... 49
• Section 7.5.3 (Current Consumption Graphs): Added section..........................................................................52
• Section 7.5.4 (Reducing Current Consumption): Updated section................................................................... 54
• Section 7.5.4.1 (Typical Current Reduction per Disabled Peripheral): Updated table...................................... 54
• Section 7.7 (Thermal Resistance Characteristics for PN Package): Added section.........................................56
• Section 7.8 (Thermal Resistance Characteristics for PM Package): Added section........................................ 56
• Section 7.9 (Thermal Resistance Characteristics for PT Package): Added section......................................... 57
• Section 7.11.2.2.1 (Reset (XRSn) Timing Requirements): Updated tw(RSL2).................................................... 60
• Section 7.11.2.2.2 (Reset (XRSn) Switching Characteristics): Added tboot-flash................................................ 60
• Figure 7-8 (Power-on Reset): Updated figure...................................................................................................60
• Section 7.11.3.2.1.6 (Internal Clock Frequencies): Updated MAX f(VCOCLK).....................................................65
• Section 7.11.3.5 (Internal Oscillators): Updated section...................................................................................69
• Section 7.11.3.5.1 (INTOSC Characteristics): Updated fINTOSC MIN values and MAX values......................... 69
• Section 7.11.4 (Flash Parameters): Updated section....................................................................................... 70
• Table 7-4 (Minimum Required Flash Wait States with Different Clock Sources and Frequencies): Updated
table and footnotes........................................................................................................................................... 70
• Table 7-5 (Flash Parameters): Added "The on-chip flash memory is in an erased state ..." footnote.............. 70
• Section 7.11.5 (Emulation/JTAG): Updated link of Hardware Breakpoints and Watchpoints for C28x in CCS....
72
• Figure 7-31 (Analog Group Connections): Added figure.................................................................................. 86
• Figure 7-35 (ADC Timings): Updated tINT......................................................................................................... 98
• Section 7.14.2.1.1 (I2C Timing Requirements): Updated table...................................................................... 125
• Section 7.14.2.1.2 (I2C Switching Characteristics): Updated table................................................................ 125
• Figure 7-54 (I2C Timing Diagram): Added figure............................................................................................125
• Figure 7-56 (SCI Block Diagram): Updated figure.......................................................................................... 130
• Figure 7-59 (SPI Master Mode External Timing (Clock Phase = 1)): Updated parameter 24.........................134
• Section 7.14.5.2.1 (SPI Slave Mode Timing Requirements): Updated MIN value of tsu(STE)S........................ 138
• Section 7.14.8 (Host Interface Controller (HIC)): Updated list of features......................................................149
• Figure 7-70 (HIC Block Diagram): Updated figure..........................................................................................149
• Section 7.14.8.1.1 (HIC Timing Requirements): Updated table......................................................................150
• Section 7.14.8.1.2 (HIC Switching Characteristics): Updated table................................................................150
• Figure 7-71 (Read/Write Operation With nOE and nWE Pins): Added figure.................................................151
• Figure 7-72 (Read/Write Operation With RnW Pin): Added figure..................................................................151
• Figure 8-1 (Functional Block Diagram): Added "Secure Memories shown in Red" legend box..................... 154
• Table 8-2 (Addresses of Flash Sectors): Updated table................................................................................. 156
• Table 8-4 (Device Identification Registers): Removed PARTIDH for TMS320F280024, TMS320F280024C,
and TMS320F280022..................................................................................................................................... 160
• Table 8-4: Added REVID for Revision A silicon.............................................................................................. 160
• Table 8-4: Updated ADDRESS of UID_UNIQUE............................................................................................160
• Section 8.10 (Device Boot Modes): Updated section..................................................................................... 166
• Section 8.10.1 (Device Boot Configurations): Added Note about CAN boot mode turning on the XTAL....... 166
• Figure 8-3 (Windowed Watchdog): Removed SCSR.WDOVERRIDE............................................................ 173
• Section 9.1 (TI Reference Design): Updated section..................................................................................... 178
• Removed Related Links section (Section 10.5 in SPRSP45).........................................................................179
• Section 10.1 (Getting Started and Next Steps): Added section......................................................................179
• Section 10.2 (Device and Development Support Tool Nomenclature): Updated section................................179
• Figure 10-1 (Device Nomenclature): Removed 280024, 280024C, and 280022 from DEVICE..................... 179
• Figure 10-2 (Package Symbolization for PM and PN Packages): Updated figure..........................................180
• Figure 10-3 (Package Symbolization for PT Package): Updated figure......................................................... 180
• Table 10-1 (Revision Identification): Added data for Revision A silicon..........................................................180
• Section 10.4 (Tools and Software): Updated section......................................................................................182
• Section 10.5 (Documentation Support): Updated section...............................................................................183
5 Device Comparison
Table 5-1. Device Comparison
F280025
F280023
(1) F280025-Q1 F280021
FEATURE F280023-Q1
F280025C F280021-Q1
F280023C
F280025C-Q1
PROCESSOR AND ACCELERATORS
Frequency (MHz) 100
FPU32 Yes (with new instructions for Fast Integer Division)
C28x VCRC Yes
TMU – Type 1 Yes (with new instructions supporting NLPID)
Fast Integer Division Yes
DMA – Type 0 Yes
MEMORY
Flash 128KB (64KW) 64KB (32KW) 32KB (16KW)
Dedicated and Local Shared RAM 20KB (10KW)
RAM Global Shared RAM 4KB (2KW)
TOTAL RAM 24KB (12KW)
Code security for on-chip flash and RAM Yes
SYSTEM
(2)
Configurable Logic Block (CLB) (F280025C-2 tiles) (F280023C-2 tiles) -
32-bit CPU timers 3
Watchdog-timer 1
Nonmaskable Interrupt Watchdog (NMIWD) timers 1
Crystal oscillator/External clock input 1
0-pin internal oscillator 2
80-pin PN 39
64-pin PM 26
(1) A type change represents a major functional feature difference in a peripheral module. Within a peripheral type, there may be minor
differences between devices that do not affect the basic functionality of the module.
(2) C devices include additional Motor Control libraries in ROM. Contact TI for more information.
(3) Time between start of sample-and-hold window to start of sample-and-hold window of the next conversion.
(4) For devices that are available in more than one package, the peripheral count listed in the smaller package is reduced because the
smaller package has less device pins available. The number of peripherals internally present on the device is not reduced co
(5) The letter Q refers to AEC Q100 qualification for automotive applications.
GPIO37/TDO
GPIO35/TDI
GPIO19,X1
GPIO18,X2
GPIO42
GPIO39
GPIO43
GPIO32
GPIO27
GPIO26
GPIO25
GPIO24
VDDIO
GPIO3
GPIO4
GPIO8
VDD
TMS
VSS
TCK
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
GPIO2 61 40 GPIO17
GPIO1 62 39 GPIO16
GPIO0 63 38 GPIO33
GPIO40 64 37 GPIO11
GPIO23 65 36 GPIO12
GPIO41 66 35 GPIO13
GPIO22 67 34 FLT1
GPIO7 68 33 FLT2
GPIO44 69 32 VDDIO
VSS 70 31 VDD
VDD 71 30 VSS
VDDIO 72 29 A10,C10
GPIO45 73 28 A9,C8
GPIO5 74 27 A4,C14
GPIO9 75 26 VDDA
GPIO10 76 25 VSSA
GPIO34 77 24 A8,C11
GPIO15 78 23 A7,C3
GPIO14 79 22 A12,C1
GPIO6 80 21 VREFLO
10
12
13
14
15
16
17
18
19
20
11
1
Not to scale
GPIO30
GPIO31
GPIO29
GPIO28
GPIO46
VDDIO
VREFHI
XRSn
VDD
VSS
A6
C6
A3,C5
A2,C9
A15,C7
A14,C4
A11,C0
A5,C2
A1
A0,C15
A. Only the GPIO function is shown on GPIO terminals. See Table 6-1 for the complete, muxed signal name.
GPIO37/TDO
GPIO35/TDI
GPIO19_X1
GPIO18_X2
GPIO39
GPIO32
GPIO24
GPIO17
GPIO16
VDDIO
GPIO4
GPIO8
VDD
TMS
VSS
TCK
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
GPIO3 49 32 GPIO33
GPIO2 50 31 GPIO11
GPIO1 51 30 GPIO12
GPIO0 52 29 GPIO13
GPIO40 53 28 VDDIO
GPIO23 54 27 VDD
GPIO41 55 26 VSS
GPIO22 56 25 A10,C10
GPIO7 57 24 A9,C8
VSS 58 23 A4,C14
VDD 59 22 VDDA
VDDIO 60 21 VSSA
GPIO5 61 20 A8,C11
GPIO9 62 19 A7,C3
GPIO10 63 18 A12,C1
GPIO6 64 17 VREFLO
10
12
13
14
15
16
11
1
Not to scale
GPIO29
GPIO28
VREFHI
XRSn
VDD
VSS
A6
C6
A3,C5,VDAC
A2,C9
A15,C7
A14,C4
A11,C0
A5,C2
A1
A0,C15
A. Only the GPIO function is shown on GPIO terminals. See Table 6-1 for the complete, muxed signal name.
GPIO37/TDO
GPIO35/TDI
GPIO19_X1
GPIO18_X2
GPIO32
GPIO24
GPIO16
GPIO33
VDDIO
VDD
TMS
TCK
36
35
34
33
32
31
30
29
28
27
26
25
VSS 37 24 GPIO12
GPIO4 38 23 GPIO13
GPIO3 39 22 VSS
GPIO2 40 21 A10,C10
GPIO1 41 20 A9,C8
GPIO0 42 19 A4,C14
GPIO7 43 18 VDDA
VSS 44 17 VSSA
VDD 45 16 A8,C11
VDDIO 46 15 A7,C3
GPIO5 47 14 A12,C1
GPIO6 48 13 VREFLO
10
12
11
1
Not to scale
GPIO29
GPIO28
VREFHI
XRSn
A6,C6
A3,C5,VDAC
A2,C9
A11,C0
A15,C7
A5,C2
A1
A0,C15
A. Only the GPIO function is shown on GPIO terminals. See Table 6-1 for the complete, muxed signal name.
Note
GPIO20, GPIO21, GPIO36 and GPIO38 do not exist on this device. GPIO61 to GPIO63 exist but are
not pinned out on any packages. Boot ROM enables pullups on GPIO61 to GPIO63. For more details,
see Section 6.5.
Note
The analog pins that contain AIOs are in analog mode by default. AIO mode is enabled by configuring the AMSEL option of GPIOH for the
analog pin. In addition, if using the HIC mux options on the AIO pins, an external pullup is required.
Note
If digital signals with sharp edges (high dv/dt) are connected to the AIOs, cross-talk can occur with
adjacent analog signals. The user should therefore limit the edge rate of signals connected to AIOs if
adjacent channels are being used for analog functions.
GPIO0 Asynchronous
Synchronous Input X-BAR
Sync. + Qual. Other Sources 127:16
GPIOx
eCAP
Modules
INPUT[16:1] 15:0
INPUT16
INPUT15
INPUT14
INPUT13
INPUT12
INPUT10
INPUT11
INPUT6
INPUT5
INPUT4
INPUT3
INPUT2
INPUT1
INPUT9
INPUT8
INPUT7
XINT1 TRIP4
XINT2 TRIP5 ePWM
CPU PIE XINT3 Modules
XINT4 TRIP7
XINT5 TRIP8
ePWM TRIP9
X-BAR
TRIP10
TRIP11
TRIP12
Other
Sources
ADC ADCEXTSOC
EXTSYNCIN1 ePWM and eCAP
EXTSYNCIN2 Sync Scheme
Other Sources
Output X-BAR
6.4.4 GPIO Output X-BAR, CLB X-BAR, CLB Output X-BAR, and ePWM X-BAR
The Output X-BAR has eight outputs that can be selected on the GPIO mux as OUTPUTXBARx. The CLB X-
BAR has eight outputs that are connected to the CLB global mux as AUXSIGx. The CLB Output X-BAR has
eight outputs that can be selected on the GPIO mux as CLB_OUTPUTXBARx. The ePWM X-BAR has eight
outputs that are connected to the TRIPx inputs of the ePWM. The sources for the Output X-BAR, CLB X-BAR,
CLB Output X-BAR, and ePWM X-BAR are shown in Figure 6-5. For details on the Output X-BAR, CLB X-BAR,
CLB Output X-BAR, and ePWM X-BAR, see the Crossbar (X-BAR) chapter of the TMS320F28002x Real-Time
Microcontrollers Technical Reference Manual.
CTRIPOUTH
CTRIPOUTL (Output X-BAR only)
CMPSSx
CTRIPH
CTRIPL (ePWM X-BAR only)
OUTPUTXBAR1
OUTPUTXBAR2
OUTPUTXBAR3
Output OUTPUTXBAR4
X-BAR OUTPUTXBAR5
OUTPUTXBAR6
OUTPUTXBAR7
OUTPUTXBAR8
CLB_OUTPUTXBAR1
CLB_OUTPUTXBAR2
CLB CLB_OUTPUTXBAR3
CLB_OUTPUTXBAR4
CLB Input X-BAR CLB TILEx Output CLB_OUTPUTXBAR5
X-BAR CLB_OUTPUTXBAR6
CLB_OUTPUTXBAR7
CLB_OUTPUTXBAR8
Figure 6-5. Output X-BAR, CLB X-BAR, CLB Output X-BAR, and ePWM X-BAR Sources
(1) Pins not bonded out in a given package will have the internal pullups enabled by the Boot ROM.
DIGITAL
• No Connect
FLT1 (Flash Test pin 1) • Tie to VSS through 4.7-kΩ or larger resistor
• No Connect
FLT2 (Flash Test pin 2) • Tie to VSS through 4.7-kΩ or larger resistor
When TDI mux option is selected (default), the GPIO is in Input mode.
GPIO35/TDI • Internal pullup enabled
• External pullup resistor
When TDO mux option is selected (default), the GPIO is in Output mode only during JTAG activity;
otherwise, it is in a tri-state condition. The pin must be biased to avoid extra current on the input buffer.
GPIO37/TDO • Internal pullup enabled
• External pullup resistor
• No Connect
TCK • Pullup resistor
7 Specifications
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device.
These are stress ratings only and functional operation of the device beyond the Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect
device reliability. All voltage values are with respect to VSS, unless otherwise noted.
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
VDDIO with respect to VSS –0.3 4.6
Supply voltage V
VDDA with respect to VSSA –0.3 4.6
Input voltage VIN (3.3 V) –0.3 4.6 V
Output voltage VO –0.3 4.6 V
Digital/analog input (per pin), IIK (VIN < VSS/VSSA or VIN >
–20 20
VDDIO/VDDA)(2)
Input clamp current mA
Total for all inputs, IIKTOTAL
–20 20
(VIN < VSS/VSSA or VIN > VDDIO/VDDA)
Output current Digital output (per pin), IOUT –20 20 mA
Free-Air temperature TA –40 125 °C
Operating junction temperature TJ –40 150 °C
Storage temperature(1) Tstg –65 150 °C
(1) Long-term high-temperature storage or extended use at maximum temperature conditions may result in a reduction of overall device
life. For additional information, see the Semiconductor and IC Package Thermal Metrics Application Report.
(2) Continuous clamp current per pin is ±2 mA. Do not operate in this condition continuously as VDDIO/VDDA voltage may internally rise and
impact other electrical specifications.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
Device supply voltage, VDDIO and Internal BOR enabled(3) VBOR-VDDIO(MAX) + VBOR-GB (2) 3.3 3.63
V
VDDA Internal BOR disabled 2.8 3.3 3.63
Device ground, VSS 0 V
Analog ground, VSSA 0 V
Supply ramp rate of VDDIO,
SRSUPPLY 20 100 mV/us
VDDA with respect to VSS.(4)
VDDIO supply ramp time from
tVDDIO-RAMP 10 ms
1 V to VBOR-VDDIO(MAX)
Digital input voltage VSS – 0.3 VDDIO + 0.3 V
VIN
Analog input voltage VSSA – 0.3 VDDA + 0.3 V
VBOR-GB VDDIO BOR guard band(5) 0.1 V
Junction temperature, TJ S version(1) –40 125 °C
Q version(1)
Free-Air temperature, TA –40 125 °C
(AEC Q100 qualification)
(1) Operation above TJ = 105°C for extended duration will reduce the lifetime of the device. See Calculating Useful Lifetimes of Embedded
Processors for more information.
(2) The VDDIO BOR voltage (VBOR-VDDIO[MAX]) in Electrical Characteristics table determines the lower voltage bound for device
operation. TI recommends that system designers budget an additional guard band (VBOR-GB) as shown in Supply Voltages figure.
(3) Internal BOR is enabled by default.
(4) Supply ramp rate faster than this can trigger the on-chip ESD protection.
(5) TI recommends VBOR-GB to avoid BOR resets due to normal supply noise or load-transient events on the 3.3-V VDDIO system
regulator. Good system regulator design and decoupling capacitance (following the system regulator specifications) are important to
prevent activation of the BOR during normal device operation. The value of VBOR-GB is a system-level design consideration; the voltage
listed here is typical for many applications.
Supply Voltages
3.63 V +10%
Recommended
System Voltage
3.3 V 0% Regulator Range F28002x
VDDIO
Operating
Range
3.1 V –6.1%
VBOR-GB
BOR Guard Band
3.0 V –9.1%
VBOR-VDDIO
Internal BOR Threshold
2.81 V –14.8%
2.80 V –15.1%
RESET MODE
VDDIO current consumption while
IDDIO 8.6 mA
reset is active(2)
VDDA current consumption while reset
IDDA 0.1 mA
is active(2)
(1) Brownout events during flash programming can corrupt flash data and permanently lock the device. Programming environments using
alternate power sources (such as a USB programmer) must be capable of supplying the rated current for the device and other system
components with sufficient margin to avoid supply brownout conditions.
(2) This is the current consumption while reset is active, i.e XRSn is low.
Figure 7-2. Operating Current Versus Frequency Figure 7-3. Operating Current Versus Temperature
Figure 7-4. Current Versus Temperature – Figure 7-5. Current Versus Temperature –
IDLE Mode STANDBY Mode
(1) This current represents the current drawn by the digital portion of the each module.
(2) eCAP3 can also be configured as HRCAP.
(1) See Pins With Internal Pullup and Pulldown table for a list of pins with a pullup or pulldown.
(2) The analog pins are specified separately; see Per-Channel Parasitic Capacitance table.
(3) See the Supply Voltages figure in the Recommended Operating Conditions section.
(1) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on a
JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these EIA/
JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(2) lfm = linear feet per minute
(1) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on a
JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these EIA/
JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(2) lfm = linear feet per minute
(1) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on a
JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these EIA/
JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(2) lfm = linear feet per minute
7.11 System
7.11.1 Power Management
TMS320F28002x real-time MCUs use an internal 1.2-V LDO Voltage Regulator (VREG) to supply the required
1.2 V to the core (VDD).
7.11.1.1 Internal 1.2-V LDO Voltage Regulator (VREG)
The internal VREG is supplied by VDDIO and generates the 1.2 V required to power the VDD pins. The internal
VREG is always enabled and, as such, is the required supply source for the VDD pins. Although the internal
VREG eliminates the need to use an external power supply for VDD, decoupling capacitors are required on each
VDD pin for VREG stability. There are two recommended capacitor configurations (described in the list that
follows) for the VDD rail when using the internal VREG. The signal description for VDD can be found in Table
6-4.
• Configuration 1: Place a small decoupling capacitor to VSS on each pin as close to the device as possible. In
addition, a bulk capacitance must be placed on the VDD node to VSS (one 10-µF capacitor or two parallel
4.7-µF capacitors).
• Configuration 2: Distribute the total capacitance to VSS evenly across all VDD pins (total capacitance divided
by number of available VDD pins).
7.11.1.2 Power Sequencing
Signal Pin Requirements: Before powering the device, no voltage larger than 0.3 V above VDDIO can be
applied to any digital pin, and no voltage larger than 0.3 V above VDDA can be applied to any analog pin
(including VREFHI).
VDDIO and VDDA Requirements: The 3.3-V supplies VDDIO and VDDA should be powered up together and
kept within 0.3 V of each other during functional operation.
VDD Requirements: The VDD sequencing requirements are handled by the device.
7.11.1.3 Power-On Reset (POR)
An internal power-on reset (POR) circuit holds the device in reset and keeps the I/Os in a high-impedance state
during power up. The POR is in control and forces XRSn low internally until the voltage on VDDIO crosses the
POR threshold. When the voltage crosses the POR threshold, the internal brownout-reset (BOR) circuit takes
control and holds the device in reset until the voltage crosses the BOR threshold (for internal BOR details, see
Section 7.11.1.4).
7.11.1.4 Brownout Reset (BOR)
An internal BOR circuit monitors the VDDIO rail for dips in voltage which result in the supply voltage dropping out
of operational range. When the VDDIO voltage drops below the BOR threshold, the device is forced into reset,
and XRSn is pulled low. XRSn will remain in reset until the voltage returns to the operational range. The BOR is
enabled by default. To disable the BOR, set the BORLVMONDIS bit in the VMONCTL register. The internal BOR
circuit monitors only the VDDIO rail. See Section 7.6 for BOR characteristics. External supply voltage supervisor
(SVS) devices can be used to monitor the voltage on the 3.3-V rail and to drive XRSn low if supplies fall outside
operational specifications.
2.2 kW to 10 kW
Optional open-drain
XRSn
Reset source
£100 nF
The parameter th(boot-mode) must account for a reset initiated from any of these sources.
See the Resets section of the System Control chapter in the TMS320F28002x Real-Time Microcontrollers
Technical Reference Manual.
CAUTION
Some reset sources are internally driven by the device. Some of these sources will drive XRSn low,
use this to disable any other devices driving the boot pins. The SCCRESET and debugger reset
sources do not drive XRSn; therefore, the pins used for boot mode should not be actively driven by
other devices in the system. The boot configuration has a provision for changing the boot pins in
OTP; for more details, see the TMS320F28002x Real-Time Microcontrollers Technical Reference
Manual.
VDDIO VDDA
(3.3V)
VDD (1.2V)
tw(RSL1)
XRSn(A)
tboot-flash
Boot ROM
CPU
Execution
Phase
User code
th(boot-mode)(B) User code dependent
tw(RSL2)
XRSn
User code
CPU
Execution User code Boot ROM
Phase
Boot ROM execution starts
(initiated by any reset source) th(boot-mode)(A)
I/O Pins User-Code Dependent GPIO Pins as Input (Pullups are Disabled)
User-Code Dependent
A. After reset from any source (see Section 7.11.2.1), the Boot ROM code samples BOOT Mode pins. Based on the status of the Boot
Mode pin, the boot code branches to destination memory or boot code function. If Boot ROM code executes after power-on conditions (in
debugger environment), the Boot code execution time is based on the current SYSCLK speed. The SYSCLK will be based on user
environment and could be with or without PLL enabled.
(1) On reset, internal oscillator 2 (INTOSC2) is the default clock source for the PLL (OSCCLK).
SYSCLKDIVSEL PLLSYSCLK
Watchdog NMIWD
Timer
SYS
PLLRAWCLK Divider FPU
INTOSC1 SYSPLL CPUCLK TMU
OSCCLK Flash
INTOSC2 SYSPLLCLKEN
X1 (XTAL)
OSCCLKSRCSEL
CPU
ePIE Boot ROM
GPIO DCSM
SYSCLK SYSCLK Mx RAMs System Control
Lx RAMs WD
GSx RAMs XINT
CPUTIMERs I2C
One per SYSCLK peripheral CLB ADC
ECAP CMPSS
PCLKCRx PERx.SYSCLK EQEP CAN
EPWM HIC
HRCAL DCC
PMBUS HWBIST
LIN BGCRC
FSI ERAD
CLKSRCCTL2.CANxBCLKSEL
SYSPLL
÷
IMULT
In Figure 7-11,
f OSCCLK IMULT
f PLLRAWCLK REFDIV 1
u
ODIV 1
(1) The PLL lock time here defines the typical time that takes for the PLL to lock once PLL is enabled (SYSPLLCTL1[PLLENA]=1).
Additional time to verify the PLL clock using Dual Clock Comparator (DCC) is not accounted here. TI recommends using the latest
example software from C2000Ware for initializing the PLLs. For the system PLL, see InitSysPll() or SysCtl_setClock().
(1) PLL output frequency when OSCCLK is dead (Loss of OSCCLK causes PLL to Limp).
Microcontroller Microcontroller
* Available as a
+3.3 V
GPIO when X1 is
used as a clock
VDD Out
3.3-V Oscillator
Gnd
Figure 7-12. Single-ended 3.3-V External Clock Figure 7-13. External Crystal
Microcontroller
GPIO19 GPIO18
VSS X1 X2
(1) Start-up time is dependent on the crystal and tank circuit components. TI recommends that the crystal vendor characterize the
application with the chosen crystal.
Frequency, INTOSC1 and -40°C to 125°C 9.8 (–2.0%) 10 10.15 (1.5%) MHz
fINTOSC
INTOSC2 -30°C to 90°C 9.85 (–1.5%) 10 10.15 (1.5%) MHz
30°C, Nominal
fINTOSC-STABILITY Frequency stability ±0.1 %
VDDIO
tINT0SC-ST Start-up and settling time 20 µs
(1) Flash SLEEP operations require an extra wait state when using INTOSC as the clock source for the frequency ranges indicated. Any
wait state FRDCNTL[RWAIT] change must be made before beginning a SLEEP mode operation. This setting impacts both flash banks.
The F28002x devices have an improved 128-bit prefetch buffer that provides high flash code execution efficiency
across wait states. Figure 7-15 and Figure 7-16 illustrate typical efficiency across wait-state settings compared to
previous-generation devices with a 64-bit prefetch buffer. Wait-state execution efficiency with a prefetch buffer
will depend on how many branches are present in application software. Two examples of linear code and if-then-
else code are provided.
100% 100%
95%
90%
90%
80%
Efficiency (%)
Efficiency (%)
85%
70% 80%
60% 75%
30% 55%
0 1 2 3 4 5 0 1 2 3 4 5
Wait State D005 Wait State D006
Figure 7-15. Application Code With Heavy 32-Bit Figure 7-16. Application Code With 16-Bit If-Else
Floating-Point Math Instructions Instructions
(1) Program time is at the maximum device frequency. Program time includes overhead of the flash state machine but does not include
the time to transfer the following into RAM:
• Code that uses flash API to program the flash
• Flash API itself
• Flash data to be programmed
In other words, the time indicated in this table is applicable after all the required code/data is available in the device RAM, ready for
programming. The transfer time will significantly vary depending on the speed of the JTAG debug probe used.
Program time calculation is based on programming 144 bits at a time at the specified operating frequency. Program time includes
Program verify by the CPU. The program time does not degrade with write/erase (W/E) cycling, but the erase time does.
Erase time includes Erase verify by the CPU and does not involve any data transfer.
(2) Erase time includes Erase verify by the CPU.
(3) The on-chip flash memory is in an erased state when the device is shipped from TI. As such, erasing the flash memory is not required
prior to programming, when programming the device for the first time. However, the erase operation is needed on all subsequent
programming operations.
Note
The Main Array flash programming must be aligned to 64-bit address boundaries and each 64-bit
word may only be programmed once per write/erase cycle.
The DCSM OTP programming must be aligned to 128-bit address boundaries and each 128-bit word
may only be programmed once. The exceptions are:
1. The DCSM Zx-LINKPOINTER1 and Zx-LINKPOINTER2 values in the DCSM OTP should be
programmed together, and may be programmed 1 bit at a time as required by the DCSM operation.
2. The DCSM Zx-LINKPOINTER3 values in the DCSM OTP may be programmed 1 bit at a time on a
64-bit boundary to separate it from Zx-PSWDLOCK, which must only be programmed once.
7.11.5 Emulation/JTAG
The JTAG (IEEE Standard 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture) port has
four dedicated pins: TMS, TDI, TDO, and TCK. The cJTAG (IEEE Standard 1149.7-2009 for Reduced-Pin and
Enhanced-Functionality Test Access Port and Boundary-Scan Architecture) port is a compact JTAG interface
requiring only two pins (TMS and TCK), which allows other device functionality to be muxed to the traditional
GPIO35 (TDI) and GPIO37 (TDO) pins.
Typically, no buffers are needed on the JTAG signals when the distance between the MCU target and the JTAG
header is smaller than 6 inches (15.24 cm), and no other devices are present on the JTAG chain. Otherwise,
each signal should be buffered. Additionally, for most JTAG debug probe operations at 10 MHz, no series
resistors are needed on the JTAG signals. However, if high emulation speeds are expected (35 MHz or so), 22-Ω
resistors should be placed in series on each JTAG signal.
The PD (Power Detect) terminal of the JTAG debug probe header should be connected to the board's 3.3-V
supply. Header GND terminals should be connected to board ground. TDIS (Cable Disconnect Sense) should
also be connected to board ground. The JTAG clock should be looped from the header TCK output terminal back
to the RTCK input terminal of the header (to sense clock continuity by the JTAG debug probe). This MCU does
not support the EMU0 and EMU1 signals that are present on 14-pin and 20-pin emulation headers. These
signals should always be pulled up at the emulation header through a pair of board pullup resistors ranging from
2.2 kΩ to 4.7 kΩ (depending on the drive strength of the debugger ports). Typically, a 2.2-kΩ value is used.
Header terminal RESET is an open-drain output from the JTAG debug probe header that enables board
components to be reset through JTAG debug probe commands (available only through the 20-pin header).
Figure 7-17 shows how the 14-pin JTAG header connects to the MCU’s JTAG port signals. Figure 7-18 shows
how to connect to the 20-pin JTAG header. The 20-pin JTAG header terminals EMU2, EMU3, and EMU4 are not
used and should be grounded.
For more information about hardware breakpoints and watchpoints, see Hardware Breakpoints and Watchpoints
for C28x in CCS.
For more information about JTAG emulation, see the XDS Target Connection Guide.
Note
JTAG Test Data Input (TDI) is the default mux selection for the pin. The internal pullup is disabled by
default. If this pin is used as JTAG TDI, the internal pullup should be enabled or an external pullup
added on the board to avoid a floating input. In the cJTAG option, this pin can be used as GPIO.
JTAG Test Data Output (TDO) is the default mux selection for the pin. The internal pullup is disabled
by default. The TDO function will be in a tri-state condition when there is no JTAG activity, leaving this
pin floating. The internal pullup should be enabled or an external pullup added on the board to avoid a
floating GPIO input. In the cJTAG option, this pin can be used as GPIO.
4.7 kΩ
1 2
TMS TMS TRST
3.3 V
10 kΩ
(A) 3 4
TDI TDI TDIS GND
MCU 3.3 V 100 Ω
5 6
3.3 V PD KEY
10 kΩ
(A) 7 8
TDO TDO GND
9 RTCK GND 10
A. TDI and TDO connections are not required for cJTAG option and these pins can be used as GPIOs instead.
3.3 V
4.7 kΩ
1 2
TMS TMS TRST
3.3 V
10 kΩ
(A) 3 4
MCU TDI TDI TDIS GND
3.3 V 100 Ω
3.3V 5 PD 6
KEY
10 kΩ
(A) 7 8
TDO TDO GND
9 10
RTCK GND
11 12
TCK TCK GND
4.7 kΩ 4.7 kΩ
13 14
3.3 V EMU0 EMU1 3.3 V
15 16
RESET GND
Open
Drain 17 18
EMU2 EMU3
TCK
TDO
3 4
TDI/TMS
(1) Rise time and fall time vary with load. These values assume a 40-pF load.
GPIO
tr(GPIO)
tf(GPIO)
(1) "n" represents the number of qualification samples as defined by GPxQSELn register.
(2) For tw(GPI), pulse width is measured from VIL to VIL for an active low signal and VIH to VIH for an active high signal.
(A)
GPIO Signal GPxQSELn = 1,0 (6 samples)
1 1 0 0 0 0 0 0 0 1 0 0 0 1 1 1 1 1 1 1 1 1
SYSCLK
QUALPRD = 1
(SYSCLK/2)
(D)
Output From
Qualifier
A. This glitch will be ignored by the input qualifier. The QUALPRD bit field specifies the qualification sampling period. It can vary from 00 to
0xFF. If QUALPRD = 00, then the sampling period is 1 SYSCLK cycle. For any other value "n", the qualification sampling period in 2n
SYSCLK cycles (that is, at every 2n SYSCLK cycles, the GPIO pin will be sampled).
B. The qualification period selected through the GPxCTRL register applies to groups of eight GPIO pins.
C. The qualification block can take either three or six samples. The GPxQSELn Register selects which sample mode is used.
D. In the example shown, for the qualifier to detect the change, the input should be stable for 10 SYSCLK cycles or greater. In other words,
the inputs should be stable for (5 × QUALPRD × 2) SYSCLK cycles. This would ensure 5 sampling periods for detection to occur.
Because external signals are driven asynchronously, an 13-SYSCLK-wide pulse ensures reliable recognition.
SYSCLK
GPIOxn
tw(GPI)
7.11.7 Interrupts
The C28x CPU has fourteen peripheral interrupt lines. Two of them (INT13 and INT14) are connected directly to
CPU timers 1 and 2, respectively. The remaining twelve are connected to peripheral interrupt signals through the
enhanced Peripheral Interrupt Expansion (ePIE) module. The ePIE multiplexes up to sixteen peripheral
interrupts into each CPU interrupt line. It also expands the vector table to allow each interrupt to have its own
ISR. This allows the CPU to support a large number of peripherals.
An interrupt path is divided into three stages—the peripheral, the ePIE, and the CPU. Each stage has its own
enable and flag registers. This system allows the CPU to handle one interrupt while others are pending,
implement and prioritize nested interrupts in software, and disable interrupts during certain critical tasks.
Figure 7-24 shows the interrupt architecture for this device.
TINT0
TIMER0
TIMER1 INT13
tw(INT)
XINT1, XINT2, XINT3,
XINT4, XINT5
td(INT)
Address bus
Interrupt Vector
(internal)
(1) The Flash module is not powered down by hardware in any LPM. It may be powered down using software if required by the
application. For more information, see the Flash and OTP Memory section of the System Control chapter in the TMS320F28002x Real-
Time Microcontrollers Technical Reference Manual.
(2) The XTAL is not powered down by hardware in any LPM. It may be powered down by software setting the XTALCR.OSCOFF bit to 1.
This can be done at any time during the application if the XTAL is not required.
(1) This is the time taken to begin execution of the instruction that immediately follows the IDLE instruction. Execution of an ISR (triggered
by the wake-up signal) involves additional latency.
(2) This value is based on the flash power-up time, which is a function of the SYSCLK frequency, flash wait states (RWAIT), and
FPAC1[PSLEEP]. This value can be realized when SYSCLK is 200 MHz, RWAIT is 3, and FPAC1[PSLEEP] is 0x860.
XCLKOUT
tw(WAKE)
(A)
WAKE
A. WAKE can be any enabled interrupt, WDINT or XRSn. After the IDLE instruction is executed, a delay of five OSCCLK cycles (minimum)
is needed before the wake-up signal could be asserted.
Section 7.11.8.2.4 lists the STANDBY mode timing requirements, Section 7.11.8.2.5 lists the STANDBY mode
switching characteristics, and Figure 7-27 shows the timing diagram for STANDBY mode.
7.11.8.2.4 STANDBY Mode Timing Requirements
MIN MAX UNIT
QUALSTDBY = 0 | 2tc(OSCCLK) 3tc(OSCCLK)
Pulse duration, external
tw(WAKE-INT) QUALSTDBY > 0 | cycles
wake-up signal (2 + QUALSTDBY) * tc(OSCCLK)
(2 + QUALSTDBY)tc(OSCCLK) (1)
(1) This is the time taken to begin execution of the instruction that immediately follows the IDLE instruction. Execution of an ISR (triggered
by the wake-up signal) involves additional latency.
(2) This value is based on the flash power-up time, which is a function of the SYSCLK frequency, flash wait states (RWAIT), and
FPAC1[PSLEEP]. This value can be realized when SYSCLK is 200 MHz, RWAIT is 3, and FPAC1[PSLEEP] is 0x860.
Wake-up
Signal
tw(WAKE-INT)
td(WAKE-STBY)
OSCCLK
XCLKOUT
td(IDLE-XCOS)
Section 7.11.8.2.7 lists the HALT mode timing requirements, Section 7.11.8.2.8 lists the HALT mode switching
characteristics, and Figure 7-28 shows the timing diagram for HALT mode.
7.11.8.2.7 HALT Mode Timing Requirements
MIN MAX UNIT
tw(WAKE-GPIO) Pulse duration, GPIO wake-up signal(1) toscst + 2tc(OSCCLK) cycles
tw(WAKE-XRS) Pulse duration, XRS wake-up signal(1) toscst + 8tc(OSCCLK) cycles
(1) For applications using X1/X2 for OSCCLK, the user must characterize their specific oscillator start-up time as it is dependent on circuit/
layout external to the device. See Crystal Oscillator Electrical Characteristics table for more information. For applications using
INTOSC1 or INTOSC2 for OSCCLK, see Internal Oscillators section for toscst. Oscillator start-up time does not apply to applications
using a single-ended crystal on the X1 pin, as it is powered externally to the device.
td(WAKE-HALT) Wakeup from Flash - Flash module in active state 75tc(OSCCLK) cycles
Wakeup from Flash - Flash module in sleep state 17500tc(OSCCLK) (1)
Wakeup from RAM 75tc(OSCCLK)
(1) This value is based on the flash power-up time, which is a function of the SYSCLK frequency, flash wait states (RWAIT), and
FPAC1[PSLEEP]. This value can be realized when SYSCLK is 200 MHz, RWAIT is 3, and FPAC1[PSLEEP] is 0x860.
Device
HALT HALT
Status
GPIOn
td(WAKE-HALT)
tw(WAKE-GPIO)
OSCCLK
XCLKOUT
td(IDLE-XCOS)
Figure 7-29. Analog Subsystem Block Diagram (80-Pin PN and 64-Pin PM LQFPs)
CMPxHPMX
CMPx_HP0
0
CMPx_HP1
1
CMPx_HP2
2 CMPx_HP
CMPx_HP3
3
CMPx_HP4
4
CMPxHNMX
CMPx_HN0 0
To CMPSSx
CMPx_HN1 CMPx_HN
1
CMPxLNMX
CMPx_LN0 0
CMPx_LN1 CMPx_LN
1
CMPxLPMX
CMPx_LP0
0
CMPx_LP1
1
CMPx_LP2
2 CMPx_LP
CMPx_LP3
3
CMPx_LP4
4
Gx_ADCA Gx_ADCA
AIO
To ADCs
Gx_ADCC Gx_ADCC
AIO
(1) Optional external reference voltage for on-chip COMPDACs. There is an internal capacitance to VSSA on this pin whether used for ADC input or COMPDAC reference. If used as a
VDAC reference, place at least a 1-µF capacitor on this pin.
(2) Internal connection only; does not come to a device pin.
(3) A6 and C6 is double bonded as pin # 4.
Note
Not every channel may be pinned out from all ADCs. See Section 6 to determine which channels are
available.
The block diagram for the ADC core and ADC wrapper are shown in Figure 7-32.
Analog-to-Digital Core Analog-to-Digital Wrapper Logic
Input Circuit
SOCx (0-15)
TRIGSEL
Triggers
CHSEL [15:0]
...
...
ADCIN4 4
SOCxSTART[15:0]
ADCIN5 5
EOCx[15:0]
ADCIN6 6 ADCCOUNTER TRIGGER[15:0]
xV
1
IN+
ADCIN7 7 u
ADCIN8 8 DOUT1
xV
2
IN-
ADCIN9 9
ADCIN10 10
ADCIN11 11 SOC Delay Trigger
ADCIN12 12 Timestamp Timestamp
S/H Circuit Converter
ADCIN13 13
ADCIN14 14
ADCIN15 15 RESULT + -
ADCPPBxOFFCAL
ADCRESULT
0±15 Regs
saturate
ADCPPBxOFFREF
+ -
ADCPPBxRESULT
VREFHI ADCEVT
CONFIG Event
Logic ADCEVTINT
Bandgap
Reference Circuit
1.65-V Output 1
Post Processing Block (1-4)
(3.3-V Range)
0
or
2.5-V Output
(2.5-V Range) Interrupt Block (1-4)
ADCINT1-4
VREFLO
ANAREFSEL
ANAREFx2PSSEL
(1) Writing these values differently to different ADC modules could cause the ADCs to operate
asynchronously. For guidance on when the ADCs are operating synchronously or asynchronously,
see the Ensuring Synchronous Operation section of the Analog-to-Digital Converter (ADC) chapter
in the TMS320F28002x Real-Time Microcontrollers Technical Reference Manual.
Pin Voltage
VREFHI
VREFHI
ADCINx ADCINx
VREFHI/2 ADC
VREFLO
VREFLO
(VSSA)
Digital Output
2n - 1
ADC Vin
Note
The ADC inputs should be kept below VDDA + 0.3 V during operation. If an ADC input exceeds this
level, the VREF internal to the device may be disturbed, which can impact results for other ADC inputs
using the same VREF.
Note
The VREFHI pin must be kept below VDDA + 0.3 V to ensure proper functional operation. If the
VREFHI pin exceeds this level, a blocking circuit may activate, and the internal value of VREFHI may
float to 0 V internally, giving improper ADC conversion.
(1) The sample window must also be at least as long as 1 ADCCLK cycle for correct ADC operation.
(2) In internal reference mode, the reference voltage is driven out of the VREFHI pin by the device. The user should not drive a voltage
into the pin in this mode.
(1) Load current on VREFHI increases when ADC input is greater than VDDA. This causes inaccurate conversions.
(2) A ceramic capacitor with package size of 0805 or smaller is preferred. Up to ±20% tolerance is acceptable.
(3) IO activity is minimized on pins adjacent to ADC input and VREFHI pins as part of best practices to reduce capacitive coupling and
crosstalk.
(4) Variation across all channels belonging to the same ADC module.
(5) Worst case variation compared to other ADC modules.
ADC
ADCINx
Rs
Switch Ron
AC Cp Ch
VREFLO
This input model should be used with actual signal source impedance to determine the acquisition window
duration. For more information, see the Choosing an Acquisition Window Duration section of the Analog-to-
Digital Converter (ADC) chapter in the TMS320F28002x Real-Time Microcontrollers Technical Reference
Manual.
Table 7-11 lists the parasitic capacitance on each channel.
Table 7-11. Per-Channel Parasitic Capacitance
Cp (pF)
ADC CHANNEL
COMPARATOR DISABLED COMPARATOR ENABLED
ADCINA0/ADCINC15 3.3 15.8
ADCINA1 2.4 4.9
ADCINA2/ADCINC9 2.9 5.4
ADCINA3/ADCINC5(1) 71.4 73.9
ADCINA4/ADCINC14 4.5 7
ADCINA5/ADCINC2 2.7 5.2
ADCINA6 2.6 5.1
ADCINA7/ADCINC3 4.2 6.7
ADCINA8/ADCINC11 4.5 7
ADCINA9/ADCINC8 3.4 5.9
ADCINA10/ADCINC10 2.9 5.4
ADCINA11/ADCINC0 2.9 5.4
ADCINA12/ADCINC1 4.7 7.2
ADCINA14/ADCINC4 2.5 5
ADCINA15/ADCINC7 3.3 5.8
ADCINC6 2.9 5.4
(1) Pin also used to supply reference voltage for COMPDAC and includes an internal decoupling
capacitor.
Sample n
Input on SOC0.CHSEL
Input on SOC1.CHSEL
Sample n+1
SYSCLK
ADCCLK
ADCTRIG
ADCSOCFLG.SOC0
ADCSOCFLG.SOC1
ADCINTFLG.ADCINTx
tSH tLAT
tEOC
tINT
At the end of this window, the value on the S+H capacitor becomes the voltage to be converted into a digital
value. The duration is given by (ACQPS + 1) SYSCLK cycles. ACQPS can be configured individually for each
tSH
SOC, so tSH will not necessarily be the same for different SOCs.
Note: The value on the S+H capacitor will be captured approximately 5 ns before the end of the S+H window
regardless of device clock settings.
The time from the end of the S+H window until the ADC results latch in the ADCRESULTx register.
tLAT
If the ADCRESULTx register is read before this time, the previous conversion results will be returned.
The time from the end of the S+H window until the S+H window for the next ADC conversion can begin. The
tEOC
subsequent sample can start before the conversion results are latched.
The time from the end of the S+H window until an ADCINT flag is set (if configured).
If the INTPULSEPOS bit in the ADCCTL1 register is set, tINT will coincide with the conversion results being
latched into the result register.
If the INTPULSEPOS bit is 0, tINT will coincide with the end of the S+H window. If tINT triggers a read of the
tINT
ADC result register (directly through DMA or indirectly by triggering an ISR that reads the result), care must be
taken to ensure the read occurs after the results latch (otherwise, the previous results will be read).
If the INTPULSEPOS bit is 0, and the OFFSET field in the ADCINTCYCLE register is not 0, then there will be a
delay of OFFSET SYSCLK cycles before the ADCINT flag is set. This delay can be used to enter the ISR or
trigger the DMA at exactly the time the sample is ready.
(1) Refer to the "ADC: DMA Read of Stale Result" advisory in the TMS320F28002x Real-Time MCUs Silicon Errata.
(2) By default, tINT occurs one SYSCLK cycle after the S+H window if INTPULSEPOS is 0. This can be changed by writing to the OFFSET
field in the ADCINTCYCLE register.
DAC12 CTRIP2H
DAC12
Digital CTRIP1L
CMP1_LN CTRIP2L
Filter CTRIPOUT1L
CMP1_LP
ePWM X- BAR ePWMs
CTRIPOUT1H
CTRIPOUT1L
CTRIPOUT2H
CMP4_ HP Comparator Subsystem 4
CTRIPOUT2L
CMP4_ HN Digital CTRIP4H
VDDA or VDAC Filter CTRIPOUT4H Output X- BAR GPIO Mux
DAC12
DAC12 Digital CTRIP4L
CMP4_LN
Filter CTRIPOUT4L
CMP4_ LP
CTRIPOUT4H
CTRIPOUT4L
(1) The CMPSS DAC is used as the reference to determine how much hysteresis to apply. Therefore, hysteresis will scale with the
CMPSS DAC reference voltage. Hysteresis is available for all comparator input source configurations.
Note
The CMPSS inputs must be kept below VDDA + 0.3 V to ensure proper functional operation. If a
CMPSS input exceeds this level, an internal blocking circuit isolates the internal comparator from the
external pin until the external pin voltage returns below VDDA + 0.3 V. During this time, the internal
comparator input is floating and can decay below VDDA within approximately 0.5 µs. After this time,
the comparator could begin to output an incorrect result depending on the value of the other
comparator input.
CTRIPx
Logic Level CTRIPx = 1
CTRIPx = 0
COMPINxP
Voltage
0 CMPINxN or
DACxVAL
Hysteresis
CTRIPx
Logic Level CTRIPx = 1
CTRIPx = 0
COMPINxP
Voltage
0 CMPINxN or
DACxVAL
Offset Error
Ideal Gain
Actual Gain
Linearity Error
Time-Base (TB)
CTR=PRD
EPWMxSYNCI
TBCTL[PHSEN]
TBCTL[SWFSYNC]
Counter
DCAEVT1/sync(A)
Up/Down
(16 bit) DCBEVT1/sync(A)
CTR=ZERO
TBCTR
Active (16) CTR_Dir CTR=PRD EPWMx_INT
CTR=ZERO
TBPHSHR (8)
CTR=PRD or ZERO EPWMxSOCA
16 8
CTR=CMPA Event On-chip
Phase EPWMxSOCB
TBPHS Active (24) Trigger ADC
Control CTR=CMPB
And
CTR=CMPC
Interrupt
CTR=CMPD (ET) ADCSOCOUTSELECT
Counter Compare (CC)
CTR_Dir
Action
CTR=CMPA Qualifier DCAEVT1.soc(A) Select and pulse stretch
(AQ) DCBEVT1.soc(A) for external ADC
CMPAHR (8)
16 HiRes PWM (HRPWM)
CMPAHR (8)
CMPA Active (24) ADCSOCAO
ADCSOCBO
CMPA Shadow (24) EPWMA ePWMxA
A. These events are generated by the ePWM digital compare (DC) submodule based on the levels of the TRIPIN inputs.
GPIO0 Async/
Sync/ Input X-Bar
Sync+Filter
GPIOx
Other Sources 16:127
INPUT15
INPUT16
INPUT13
INPUT14
INPUT10
INPUT12
INPUT11
INPUT1
INPUT2
INPUT3
INPUT4
INPUT5
INPUT6
INPUT7
INPUT8
INPUT9
eCAPx
INPUT[1:16] 0:15
XINT1
XINT2
ADC
XINT3
Wrapper(s)
XINT4 PIE
ePWM XINT5
eCAP
EXTSYNCIN1
Sync Mux EXTSYNCIN2
TZ1 EPWMINT
TZ2 TZINT
TZ3
TRIP1
TRIP2 EPWMx.EPWMCLK
TRIP3 PCLKCR2[EPWMx]
TRIP6
TBCLKSYNC
INPUT[1:14] TRIP4 PCLKCR0[TBCLKSYNC]
CMPSSx.TRIPH
TRIP5
TRIP7
CMPSSx.TRIPHORL TRIP8
CMPSSx.TRIPL TRIP9 All
ADCx.EVT1-4 TRIP10
ePWM ePWM
ECAPx.OUT TRIP11 Modules
X-Bar
TRIP12 ADCSOCAO Select
ADCSOCBO Select
EXTSYNCOUT
ADCSOCx
SOCA ADC
Reserved Wrapper(s)
TRIP13 SOCB
ECCERR TRIP14
PIEVECTERROR TRIP15
EQEPERR TZ4 EPWMSYNCPER
CLKFAIL TZ5 CMPSS
EMUSTOP TZ6 Blanking Window
TBCTL2[OSHTSYNC]
TBCTL3[OSSFRCEN]
GLDCTL2[OSHTLD]
SWFSYNC
:ULWH ³1´ WR
:ULWH ³1´ WR
CTR=ZERO
CTR=CMPB
CTR=CMPC
TBCTL2[OSHTSYNCMODE]
CTR=CMPD
CLR
DCAEVT1.sync One Shot
DCBEVT1.sync Latch
0
Set Q
EPWMSYNCOUTEN
1
SWEN
ZEROEN
0 0
CMPBEN
1 EPWMxSYNCOUT
CMPCEN OR 1
0
CMPDEN
DCARVT1EN
TBCTL2[SELFCLRTRREM]
DCBEVT1EN
Disable Clear
Register
EPWM1SYNCOUT 0
|
|
|
EPWMxSYNCOUT
EPWMxSYNCIN HRPCTL[PWMSYNCSELX]
ECAP1SYNCOUT CTR=CMPC UP
|
|
|
CTR=CMPC DOWN
ECAPySYNCOUT CTR=CMPD UP EPWMxSYNCPER
Other Sources CTR=CMPD DOWN CMPSS
DAC
HRPCTL[PWMSYNCSEL]
EPWMSYNCINSEL CTR=PRD
CTR=ZERO
Note: SYNCO and SYNCOUT are used interchangeably
EPWMCLK
tw(TZ)
(A)
TZ
td(TZ-PWM)
(B)
PWM
tw(ADCSOCL)
ADCSOCAO
or
ADCSOCBO
Note
The minimum HRPWMCLK frequency allowed for HRPWM is 60 MHz.
(1) The MEP step size will be largest at high temperature and minimum voltage on VDD. MEP step size will increase with higher
temperature and lower voltage and decrease with lower temperature and higher voltage.
Applications that use the HRPWM feature should use MEP Scale Factor Optimizer (SFO) estimation software functions. See the TI
software libraries for details of using SFO functions in end applications. SFO functions help to estimate the number of MEP steps per
SYSCLK period dynamically while the HRPWM is in operation.
The capture functionality of the Type-1 eCAP is enhanced from the Type-0 eCAP with the following added
features:
• Event filter reset bit
– Writing a 1 to ECCTL2[CTRFILTRESET] will clear the event filter, the modulo counter, and any pending
interrupts flags. Resetting the bit is useful for initialization and debug.
• Modulo counter status bits
– The modulo counter (ECCTL2 [MODCTRSTS]) indicates which capture register will be loaded next. In the
Type-0 eCAP, it was not possible to know current state of modulo counter.
• DMA trigger source
– eCAPxDMA is added as a DMA trigger. CEVT[1–4] can be configured as the source for eCAPxDMA.
• Input multiplexer
– ECCTL0 [INPUTSEL] selects one of 128 input signals.
• EALLOW protection
– EALLOW protection is added to critical registers. To maintain software compatibility with the Type-0 eCAP,
configure DEV_CFG_REGS.ECAPTYPE to make these registers unprotected.
The capture functionality of the Type-2 eCAP is enhanced from the Type-1 eCAP with the following added
features:
• ECAPxSYNCINSEL register
– The ECAPSxYNCINSEL register is added for each eCAP to select an external SYNCIN. Every eCAP can
have a separate SYNCIN signal.
The eCAP inputs connect to any GPIO input through the Input X-BAR. The APWM outputs connect to GPIO pins
through the Output X-BAR to OUTPUTx positions in the GPIO mux. See Section 6.4.3 and Section 6.4.4.
The eCAP module is clocked by PERx.SYSCLK.
The clock enable bits (ECAP1–ECAP3) in the PCLKCR3 register turn off the eCAP module individually (for low-
power operation). Upon reset, ECAP1ENCLK is set to low, indicating that the peripheral clock is off.
7.13.3.1 High-Resolution Capture (HRCAP)
The eCAP3 module can be configured as high-resolution capture (HRCAP) submodules. The HRCAP
submodule measures the difference, in time, between pulses asynchronously to the system clock. This
submodule is new to the eCAP Type 1 module, and features many enhancements over the Type 0 HRCAP
module.
Applications for the HRCAP include:
• Capacitive touch applications
• High-resolution period and duty-cycle measurements of pulse train cycles
• Instantaneous speed measurements
• Instantaneous frequency measurements
• Voltage measurements across an isolation boundary
• Distance/sonar measurement and scanning
• Flow measurements
The HRCAP submodule includes the following features:
• Pulse-width capture in either non-high-resolution or high-resolution modes
• Absolute mode pulse-width capture
• Continuous or "one-shot" capture
• Capture on either falling or rising edge
• Continuous mode capture of pulse widths in 4-deep buffer
• Hardware calibration logic for precision high-resolution capture
• All of the resources in this list are available on any pin using the Input X-BAR.
The HRCAP submodule includes one high-resolution capture channel in addition to a calibration block. The
calibration block allows the HRCAP submodule to be continually recalibrated, at a set interval, with no “down
time”. Because the HRCAP submodule now uses the same hardware as its respective eCAP, if the HRCAP is
used, the corresponding eCAP will be unavailable.
Each high-resolution-capable channel has the following independent key resources.
• All hardware of the respective eCAP
• High-resolution calibration logic
• Dedicated calibration interrupt
eCAP and HRCAP Block Diagram
Figure 7-47 shows the eCAP and HRCAP block diagram.
SYNC
ECAPxSYNCIN
OVF CTR_OVF CTR [0−31]
ECAPxSYNCOUT TSCTR
PWM
(counter−32 bit) Output
Delta−Mode PRD [0−31] Compare
RST X-Bar
Logic
CMP [0−31]
32
CTR=PRD
CTR [0−31]
CTR=CMP
32
PRD [0−31]
HRCTRL[HRE] ECCTL1 [ CAPLDEN, CTRRSTx]
32
32 CAP1 LD1
Polarity
(APRD Active) LD
Select
APRD
32
shadow CMP [0−31]
HRCTRL[HRE] 32
32 HRCTRL[HRE]
32
CAP2 LD2 Polarity
(ACMP Active) LD Select Other
Event [127:16]
Sources
Prescale
Event
32 ACMP
qualifier 16
shadow ECCTL1[PRESCALE] Input
HRCTRL[HRE] [15:0]
X-Bar
32
Polarity
32 CAP3 LD3
LD Select
(APRD Shadow)
HRCTRL[HRE]
32
32 CAP4 LD4 Polarity
(ACMP Shadow) LD
Select
CEVT[1:4]
ECAPxDMA_INT
ECCTL2[CTRFILTRESET]
Interrupt Continuous /
Trigger Oneshot MODCNTRSTS
and CTR_OVF Capture Control
ECCTL2[DMAEVTSEL]
Flag
CTR=PRD
ECAPx Control
(to ePIE) CTR=CMP
ECCTL2 [ REARM, CONT_ONESHT, STOP_WRAP]
Registers: ECEINT, ECFLG, ECCLR, ECFRC
A. The HRCAP submodule is not available on all eCAP modules; in this case, the high-resolution muxes and hardware are not
implemented.
ECAPx
Disable 0x0
EPWM[1..7]SYNCOUT 0x1 ECAPxSYNCIN
EPWMxSYNCOUT
ECCTL2[SWSYNC] EXTSYNCOUT
ECAP[1..3]SYNCOUT CTR=PRD ECAPxSYNCOUT
Disable
INPUT5 (Input X-Bar) Disable
ECAPSYNCINSEL[SEL]
(1) Value obtained using an oscillator of 100 PPM, oscillator accuracy directly affects the HRCAP accuracy.
(2) Measurement is completed using rising-rising or falling-falling edges
(3) Opposite polarity edges will have an additional inaccuracy due to the difference between VIH and VIL. This effect is dependent on the
signal’s slew rate.
(4) Accuracy only applies to time-converted measurements.
HRCAP Result
Probability Resolution
(Step Size)
Precision
Actual (Standard Deviation)
Input Signal
A. The HRCAP has some variation in performance, this results in a probability distribution which is described using the following terms:
• Accuracy: The time difference between the input signal and the mean of the HRCAP’s distribution.
• Precision: The width of the HRCAP’s distribution, this is given as a standard deviation.
• Resolution: The minimum measurable increment.
1.8 6.66
1.6 5.92
1.4 5.18
1.2 4.44
1 3.7
0.8 2.96
0.6 2.22
0.4 1.48
0.2 0.74
0 1000 2000 3000 4000 5000 6000 7000 8000 9000 10000
Time Between Edges(nS)
A. Typical core conditions: All peripheral clocks are enabled.
B. Noisy core supply: All core clocks are enabled and disabled with a regular period during the measurement.
C. Fluctuations in current and voltage on the 1.2-V rail cause the standard deviation of the HRCAP to rise. Care should be taken to ensure
that the 1.2-V supply is clean, and that noisy internal events, such as enabling and disabling clock trees, have been minimized while
using the HRCAP.
Data bus
QCPRD
Enhanced QEP (eQEP) peripheral
QCAPCTL QCTMR
16 16
16
Quadrature
capture unit
QCTMRLAT (QCAP)
QCPRDLAT
(1) The GPIO GPxQSELn Asynchronous mode should not be used for eQEP module input pins.
Note
The CAN module uses the IP known as DCAN. This document uses the names CAN and DCAN
interchangeably to reference this peripheral.
Note
For a CAN bit clock of 100 MHz, the smallest bit rate possible is 3.90625 kbps.
Note
The accuracy of the on-chip zero-pin oscillator is in Section 7.11.3.5.1. Depending on parameters
such as the CAN bit timing settings, bit rate, bus length, and propagation delay, the accuracy of this
oscillator may not meet the requirements of the CAN protocol. In this situation, an external clock
source must be used.
CAN_H
CAN Bus
CAN_L
CAN
CAN Core
Message RAM
Message Handler
Message
RAM
Interface
32 Register and Message
Message Object Access (IFx)
Objects Test Modes
(Mailboxes) Only
Module Interface
I2C module
I2CXSR I2CDXR
TX FIFO
FIFO Interrupt
SDA
to CPU/PIE
RX FIFO
Peripheral bus
I2CRSR I2CDRR
Control/status
Clock registers CPU
SCL synchronizer
Prescaler
Note
To meet all of the I2C protocol timing specifications, the I2C module clock must be configured in the
range from 7 MHz to 12 MHz.
SDA
ACK Contd...
S6 T10 S7
T5 T7 S3
SCL S4 Contd...
9th
T6 T8 clock
S2
Repeated
START STOP
S5
SDA
ACK
T2
T9
T1
SCL
9th
clock
PCLKCR20
SYSCLK
Div PMBCTRL
ALERT DMA
Bit clock
CTL Other registers
PMBus Module
Note
All registers in this module are 8-bit registers. When a register is accessed, the register data is in the
lower byte (bits 7–0), and the upper byte (bits 15–8) is read as zeros. Writing to the upper byte has no
effect.
TXENA
SCICTL1.1
TXSHF
SCITXD
Register
Frame 8
Format and Mode
Parity
Even/Odd TXEMPTY
0 1
SCICCR.6 8 SCICTL2.6
Enable
TX FIFO_0
TXINT
SCICCR.5 To CPU
TX FIFO_1 TX FIFO Interrupts TX Interrupt
88
Logic
TX FIFO_N
TXINTENA
TXRDY SCICTL2.0
8
TXWAKE 0 1 SCICTL2.7
SCICTL1.3
WUT 8
Transmit Data
Buffer Register
SCITXBUF.7-0 Auto Baud Detect Logic
RXENA
Baud Rate
MSB/LSB SCICTL1.0
LSPCLK Registers
RXSHF
SCIRXD
Register
SCIHBAUD.15-8
RXWAKE
SCILBAUD.7-0 8
SCIRXST.1
0 1
8
SCIFFENA
SCIFFTX.14 RX FIFO_0 RXINT
8 RX FIFO_1 To CPU
RX FIFO Interrupts RX Interrupt
Logic
RX FIFO_N
RXFFOVF
8 SCIFFRX.15
0 1
RXBKINTENA
SCICTL2.1
RXRDY
SCIRXST.6
RXENA BRKDT
RXERRINTENA
SCICTL1.0
SCIRXST.5 SCICTL1.6
SCIRXST.5-2
Receive Data BRKDT FE OE PE
Buffer Register
RXERROR
SCIRXBUF.7-0
SCIRXST.7
PCLKCR8
Low-Speed
LSPCLK SYSCLK CPU
Prescaler
Bit Clock
SYSRS
Peripheral Bus
SPISIMO
SPISOMI
GPIO MUX SPI
SPIINT
SPICLK PIE
SPITXINT
SPISTE
SPIRXDMA
DMA
SPITXDMA
Note
All timing parameters for SPI High-Speed Mode assume a load capacitance of 5 pF on SPICLK,
SPISIMO, and SPISOMI.
(1) The (BRR + 1) condition is Even when (SPIBRR + 1) is even or SPIBRR is 0 or 2. It is Odd when (SPIBRR + 1) is odd and SPIBRR is
greater than 3.
(1) The (BRR + 1) condition is Even when (SPIBRR + 1) is even or SPIBRR is 0 or 2. It is Odd when (SPIBRR + 1) is odd and SPIBRR is
greater than 3.
SPICLK
(clock polarity = 0)
SPICLK
(clock polarity = 1)
4
5
Master In Data
SPISOMI
Must Be Valid
23 24
(A)
SPISTE
A. On the trailing end of the word, SPISTE will go inactive except between back-to-back transmit words in both FIFO and non-FIFO modes.
SPICLK
(clock polarity = 1)
4
5
A. On the trailing end of the word, SPISTE will go inactive except between back-to-back transmit words in both FIFO and non-FIFO modes.
SPICLK
(clock polarity = 0)
13
14
SPICLK
(clock polarity = 1)
15
16
19
20
SPISIMO Data
SPISIMO
Must Be Valid
25 26
SPISTE
12
SPICLK
(clock polarity = 0)
13 14
SPICLK
(clock polarity = 1)
15
19 16
20
25 26
SPISTE
ADDRESS BUS
CHECKSUM
CALCULATOR INTERFACE
ID PARTY
CHECKER
BIT
MONITOR
TXRX ERROR
DETECTOR (TED)
TIME-OUT
CONTROL
COUNTER
LINRX/
SCIRX COMPARE
PCLKCR18
SYSCLK
SYSRSN
C28x ePIE
FSITXyINT1
FSITXyINT2
Register Interface
Registers
FSITXyCLK
GPIO MUX
FSITXyD0
DMA FSITX
FSITXyD1
FSITXyDMA
Trigger Muxes(A)
32
A. The signals connected to the trigger muxes are described in the External Frame Trigger Mux section of the Fast Serial Interface (FSI)
chapter in the TMS320F28002x Real-Time Microcontrollers Technical Reference Manual.
FSITX
PLLRAWCLK
SYSRSN
SYSCLK
FSI Mode:
Transmit Clock TXCLKIN
TXCLK = TXCLKIN/2
Generator SPI Signaling Mode:
Register Interface TXCLK = TXCLKIN
Core Reset
FSITXINT1
Control Registers, TXCLK
FSITXINT2 Interrupt Management
FSITX_DMA_EVT Ping Time-out Counter
TXD0
Transmitter Core
Transmit Data
Buffer
ECC Logic
FSITXCLK 2
FSITXD0
FSITXD1
3
SYSCLK
SYSRSN
C28x ePIE
FSIRXyINT1
FSIRXyINT2
Register Interface
Registers
FSIRXyCLK
GPIO MUX
FSIRXyD0
DMA FSIRX
FSIRXyD1
FSIRXyDMA
FSIRX
SYSRSn
SYSCLK
Frame Watchdog
Register Interface
Core Reset
FSIRXINT1 Control Registers,
FSIRXINT2 Interrupt Management
RXCLK
FSIRX_DMA_EVT Ping Watchdog
Receiver Core Skew
RXD0
Control
RXD1
Receive Data
Buffer
ECC Check
Logic
FSIRXCLK 2
FSIRXD0
FSIRXD1
3
2
FSITXCLK
3
FSITXD0
5
4
FSITXD1
A[7:0] A[31:0]
nRDY
EVT_TRIGGER[15:0]
(1) For accesses to the device region, additional 2 SYSCLK cycles are required.
(2) For accesses to the device region with nRDY pin, additional SYSCLK cycle is required.
(1) Applicable to mailbox accesses only. Direct memory map (Device) accesses are qualified with nRDY pin.
SETUP SIGNALS
nCS T9
A[7:0]
BASESEL[2:0]
nBE[3:0]
READ SIGNALS
T1 T5
T3 T10
nOE
T7
S1 S2
D[15:0]
7
WRITE SIGNALS
T2 T6
T4 T11
nWE T8
T12 T13
D[15:0]
READY/WAIT SIGNAL
S5
nRDY S3
S6
S4
SETUP SIGNALS
nCS T19
T17 or T18
T14 T16
A[7:0]
BASESEL[2:0]
nBE[3:0]
READ SIGNALS
T15 T20
RnW
(Read)
S7 S8
D[15:0]
S10
WRITE SIGNALS
T15 T20
RnW
(Write)
T21 T22
D[15:0]
READY/WAIT SIGNAL
S9
nRDY
S11
8 Detailed Description
8.1 Overview
C2000™ 32-bit microcontrollers are optimized for processing, sensing, and actuation to improve closed-loop
performance in real-time control applications such as industrial motor drives; solar inverters and digital power;
electrical vehicles and transportation; motor control; and sensing and signal processing.
The TMS320F28002x (F28002x) is a powerful 32-bit floating-point microcontroller unit (MCU) that lets designers
incorporate crucial control peripherals, differentiated analog, and nonvolatile memory on a single device.
The real-time control subsystem is based on TI’s 32-bit C28x CPU, which provides 100 MHz of signal processing
performance. The C28x CPU is further boosted by the new TMU extended instruction set, which enables fast
execution of algorithms with trigonometric operations commonly found in transforms and torque loop
calculations; and the VCRC extended instruction set, which reduces the latency for complex math operations
commonly found in encoded applications.
The F28002x supports up to 128KB (64KW) of flash memory in one bank. Up to 24KB (12KW) of on-chip SRAM
is also available in blocks of 4KB (2KW) for efficient system partitioning. Flash ECC, SRAM ECC/parity, and
dual-zone security are also supported.
High-performance analog blocks are integrated on the F28002x real-time MCU to further enable system
consolidation. Two separate 12-bit ADCs provide precise and efficient management of multiple analog signals,
which ultimately boosts system throughput. Four analog comparator modules provide continuous monitoring of
input voltage levels for trip conditions.
The TMS320C2000™ devices contain industry-leading control peripherals with frequency-independent ePWM/
HRPWM and eCAP allow for a best-in-class level of control to the system.
Connectivity is supported through various industry-standard communication ports (such as SPI, SCI, I2C,
PMBus, LIN, and CAN) and offers multiple muxing options for optimal signal placement in a variety of
applications. New to the C2000™ platform is Host Interface Controller (HIC), a high throughput interface that
allows an external host to access resources of the TMS320F28002x. Additionally, in an industry first, the FSI
enables high-speed, robust communication to complement the rich set of peripherals that are embedded in the
device.
A specially enabled device variant, TMS320F28002xC, allows access to the Configurable Logic Block (CLB) for
additional interfacing features and allows access to the secure ROM, which includes a library to enable
InstaSPIN-FOC™. See Table 5-1 for more information.
The Embedded Real-Time Analysis and Diagnostic (ERAD) module enhances the debug and system analysis
capabilities of the device by providing additional hardware breakpoints and counters for profiling.
To learn more about the C2000 real-time MCUs, visit the C2000™ real-time control MCUs page.
14x ePWM Chan. 14x ePWM Chan. Result Data 1x PMBUS 1x CAN 2x LIN 1x SCI
4x CMPSS
(8 Hi-Res Capable) (8 Hi-Res Capable) 2x 12-Bit ADC 39x GPIO 2x SPI 2x I2C
3x eCAP 3x eCAP Input XBAR
2x CLB 1x FSI RX NMI
(1 HRCAP Capable) (1 HRCAP Capable)
Output XBAR 1x FSI TX Watchdog
2x eQEP
(CW/CCW Support) ePWM XBAR Windowed
Watchdog
CLB XBAR
8.3 Memory
8.3.1 Memory Map
The Memory Map table describes the memory map. See the Memory Controller Module section of the System
Control chapter in the TMS320F28002x Real-Time Microcontrollers Technical Reference Manual.
Table 8-1. Memory Map
START HIC DMA ECC/ ACCESS
MEMORY SIZE END ADDRESS SECURITY
ADDRESS ACCESS ACCESS PARITY PROTECTION
M0 RAM 1K x 16 0x0000 0000 0x0000 03FF - - ECC Yes -
M1 RAM 1K x 16 0x0000 0400 0x0000 07FF - - ECC Yes -
PieVectTable 512 x 16 0x0000 0D00 0x0000 0EFF - - - - -
LS4 RAM 2K x 16 0x0000 A000 0x0000 A7FF - - ECC Yes Yes
LS5 RAM 2K x 16 0x0000 A800 0x0000 AFFF - - ECC Yes Yes
LS6 RAM 2K x 16 0x0000 B000 0x0000 B7FF - - ECC Yes Yes
LS7 RAM 2K x 16 0x0000 B800 0x0000 BFFF - - ECC Yes Yes
GS0 RAM 2K x 16 0x0000 C000 0x0000 C7FF Yes Yes Parity Yes -
CAN A Message RAM 2K x 16 0x0004 9000 0x0004 97FF - - Parity - -
TI OTP(1) 1K x 16 0x0007 0000 0x0007 03FF - - ECC - -
User OTP 1K x 16 0x0007 8000 0x0007 83FF - - ECC - Yes
Flash 64K x 16 0x0008 0000 0x0008 FFFF - - ECC - Yes
Secure ROM 32K x 16 0x003E 8000 0x003E FFFF - - Parity - Yes
Boot ROM 64K x 16 0x003F 0000 0x003F FFFF - - Parity - -
Pie Vector Fetch Error
1 x 16 0x003F FFBE 0x003F FFBF - - Parity - -
(part of Boot ROM)
Default Vectors
64 x 16 0x003F FFC0 0x003F FFFF - - Parity - -
(part of Boot ROM)
F280025, Sector 5 4K x 16 0x0008 5000 0x0008 5FFF 512 x 16 0x0108 0A00 0x0108 0BFF
F280023 Sector 6 4K x 16 0x0008 6000 0x0008 6FFF 512 x 16 0x0108 0C00 0x0108 0DFF
Sector 7 4K x 16 0x0008 7000 0x0008 7FFF 512 x 16 0x0108 0E00 0x0108 0FFF
Sector 8 4K x 16 0x0008 8000 0x0008 8FFF 512 x 16 0x0108 1000 0x0108 11FF
Sector 9 4K x 16 0x0008 9000 0x0008 9FFF 512 x 16 0x0108 1200 0x0108 13FF
Sector 10 4K x 16 0x0008 A000 0x0008 AFFF 512 x 16 0x0108 1400 0x0108 15FF
Sector 11 4K x 16 0x0008 B000 0x0008 BFFF 512 x 16 0x0108 1600 0x0108 17FF
F280025
Sector 12 4K x 16 0x0008 C000 0x0008 CFFF 512 x 16 0x0108 1800 0x0108 19FF
Sector 13 4K x 16 0x0008 D000 0x0008 DFFF 512 x 16 0x0108 1A00 0x0108 1BFF
Sector 14 4K x 16 0x0008 E000 0x0008 EFFF 512 x 16 0x0108 1C00 0x0108 1DFF
Sector 15 4K x 16 0x0008 F000 0x0008 FFFF 512 x 16 0x0108 1E00 0x0108 1FFF
8.4 Identification
Table 8-4 lists the Device Identification Registers. Additional information on these device identification registers
can be found in the TMS320F28002x Real-Time Microcontrollers Technical Reference Manual.
Table 8-4. Device Identification Registers
NAME ADDRESS SIZE (x16) DESCRIPTION
Device part identification number
TMS320F280025 0x04FF 0500
TMS320F280025C 0x04FF 0500
PARTIDH 0x0005 D00A 2
TMS320F280023 0x04FD 0500
TMS320F280023C 0x04FD 0500
TMS320F280021 0x04FB 0500
Silicon revision number
REVID 0x0005 D00C 2 Revision 0 0x0000 0000
Revision A 0x0000 0001
Unique identification number. This number is different on each
individual device with the same PARTIDH. This unique number
UID_UNIQUE 0x0007 01F4 2
can be used as a serial number in the application. This number
is present only on TMS devices.
(1) These modules are accessible from DMA but cannot trigger a DMA transfer.
No changes have been made to existing instructions, pipeline or memory bus architecture. All TMU instructions
use the existing FPU register set (R0H to R7H) to carry out their operations.
Exponent instruction IEXP2F32 and logarithmic instruction LOG2F32 have been added to support computation
of floating-point power function for the non-linear proportional integral derivative control (NLPID) component of
the C2000 Digital Control Library. These two added instructions reduce the power function calculations from a
typical of 300 cycles using library emulation to less than 10 cycles.
8.6.4 VCRC Unit
Cyclic redundancy check (CRC) algorithms provide a straightforward method for verifying data integrity over
large data blocks, communication packets, or code sections. The C28x+VCRC can perform 8-bit, 16-bit, 24-bit,
and 32-bit CRCs. For example, the VCRC can compute the CRC for a block length of 10 bytes in 10 cycles. A
CRC result register contains the current CRC, which is updated whenever a CRC instruction is executed.
The following are the CRC polynomials used by the CRC calculation logic of the VCRC:
• CRC8 polynomial = 0x07
• CRC16 polynomial 1 = 0x8005
• CRC16 polynomial 2 = 0x1021
• CRC24 polynomial = 0x5d6dcb
• CRC32 polynomial 1 = 0x04c11db7
• CRC32 polynomial 2 = 0x1edc6f41
This module can calculate CRCs for a byte of data in a single cycle. The CRC calculation for CRC8, CRC16,
CRC24, and CRC32 is done byte-wise (instead of computing on a complete 16-bit or 32-bit data read by the
C28x core) to match the byte-wise computation requirement mandated by various standards.
The VCRC Unit also allows the user to provide the size (1b-32b) and value of any polynomial to fit custom CRC
requirements. The CRC execution time increases to three cycles when using a custom polynomial.
C28x bus
DMA bus
TINT(0-2) DMA_CHx(1-6)
XINT(1-5) DMA Trigger
ADCx.INT(1-5), ADCx.EVT Source Selection
CANxIF(1-3) C28x
DMACHSRCSEL1.CHx DMA
ECAP(1-3)DMA
DMACHSRCSEL2.CHx
EPWM(1-7).SOCA, EPWM(1-7.SOCB PIE
CHx.MODE.PERINTSEL
SPITXDMA(A-B), SPIRXDMA(A-B) (x = 1 to 6)
FSITXADMA, FSIRXADMA
CMPSS
eQEP
(1) SCI boot mode can be used as a wait boot mode as long as SCI continues to wait for an 'A' or 'a' during the SCI autobaud lock
process.
Note
The CAN boot mode turns on the XTAL. Be sure an XTAL is installed in the application before using
CAN boot mode.
Note
When using Z2-OTP-BOOTPIN-CONFIG, the configurations programmed in this location will take
priority over the configurations in Z1-OTP-BOOTPIN-CONFIG. It is recommended to use Z1-OTP-
BOOTPIN-CONFIG first and then if OTP configurations need to be altered, switch to using Z2-OTP-
BOOTPIN-CONFIG.
The following GPIOs cannot be used as a BMSP. If selected for a particular BMSP, the boot ROM automatically
selects the factory default GPIO (the factory default for BMSP2 is 0xFF, which disables the BMSP).
• GPIO 20 and GPIO 21
• GPIO 36 and GPIO 38
• GPIO 47 to GPIO 60
• GPIO 63 to GPIO 223
Note
When decoding the boot mode, BMSP0 is the least-significant-bit and BMSP2 is the most-significant-
bit of the boot table index value. It is recommended when disabling BMSPs to start with disabling
BMSP2. For example, in an instance when only using BMSP2 (BMSP1 and BMSP0 are disabled),
then only the boot table indexes of 0 and 4 will be selectable. In the instance when using only BMSP0,
then the selectable boot table indexes are 0 and 1.
Note
The locations Z2-OTP-BOOTDEF-LOW and Z2-OTP-BOOTDEF-HIGH will be used instead of Z1-
OTP-BOOTDEF-LOW and Z1-OTP-BOOTDEF-HIGH locations when Z2-OTP-BOOTPIN-CONFIG is
configured. Refer to Configuring Boot Mode Pins for more details on BOOTPIN_CONFIG usage.
THE CODE SECURITY MODULE (CSM) INCLUDED ON THIS DEVICE WAS DESIGNED TO
PASSWORD PROTECT THE DATA STORED IN THE ASSOCIATED MEMORY AND IS
WARRANTED BY TEXAS INSTRUMENTS (TI), IN ACCORDANCE WITH ITS STANDARD TERMS
AND CONDITIONS, TO CONFORM TO TI'S PUBLISHED SPECIFICATIONS FOR THE WARRANTY
PERIOD APPLICABLE FOR THIS DEVICE.
TI DOES NOT, HOWEVER, WARRANT OR REPRESENT THAT THE CSM CANNOT BE
COMPROMISED OR BREACHED OR THAT THE DATA STORED IN THE ASSOCIATED MEMORY
CANNOT BE ACCESSED THROUGH OTHER MEANS. MOREOVER, EXCEPT AS SET FORTH
ABOVE, TI MAKES NO WARRANTIES OR REPRESENTATIONS CONCERNING THE CSM OR
OPERATION OF THIS DEVICE, INCLUDING ANY IMPLIED WARRANTIES OF MERCHANTABILITY
OR FITNESS FOR A PARTICULAR PURPOSE.
IN NO EVENT SHALL TI BE LIABLE FOR ANY CONSEQUENTIAL, SPECIAL, INDIRECT,
INCIDENTAL, OR PUNITIVE DAMAGES, HOWEVER CAUSED, ARISING IN ANY WAY OUT OF
YOUR USE OF THE CSM OR THIS DEVICE, WHETHER OR NOT TI HAS BEEN ADVISED OF THE
POSSIBILITY OF SUCH DAMAGES. EXCLUDED DAMAGES INCLUDE, BUT ARE NOT LIMITED
TO LOSS OF DATA, LOSS OF GOODWILL, LOSS OF USE OR INTERRUPTION OF BUSINESS OR
OTHER ECONOMIC LOSS.
8.12 Watchdog
The watchdog module is the same as the one on previous TMS320C2000 devices, but with an optional lower
limit on the time between software resets of the counter. This windowed countdown is disabled by default, so the
watchdog is fully backward-compatible.
The watchdog generates either a reset or an interrupt. It is clocked from the internal oscillator with a selectable
frequency divider.
Figure 8-3 shows the various functional blocks within the watchdog module.
WDCR.WDPRECLKDIV WDCR.WDPS WDCR.WDDIS
WDCNTR
WDCLK
(INTOSC1) Overflow 1-count
delay
8-bit
WDCLK Watchdog Watchdog
Divider Prescaler Counter
SYSRSn
Clear
Count
WDWCR.MIN
WDKEY (7:0)
Out of Window Watchdog
Watchdog Good Key
Window
Key Detector Detector
WDCR(WDCHK(2:0))
55 + AA
Bad Key
WDRSTn Generate
1 0 1 512-WDCLK Watchdog Time-out
WDINTn Output Pulse
SCSR.WDENINT
Absolute encoder protocol interfaces are now provided as Position Manager solutions in the C2000Ware
MotorControl SDK. Configuration files, application programmer interface (API), and use examples for such
solutions are provided with C2000Ware MotorControl SDK. In some solutions, the TI-configured CLB is used
with other on-chip resources, such as the SPI port or the C28x CPU, to perform more complex functionality.
TMX Experimental device that is not necessarily representative of the final device's electrical specifications and
may not use production assembly flow.
TMP Prototype device that is not necessarily the final silicon die and may not necessarily meet final electrical
specifications.
TMS Production version of the silicon die that is fully qualified.
TMDX Development-support product that has not yet completed Texas Instruments internal qualification testing.
TMDS Fully-qualified development-support product.
TMX and TMP devices and TMDX development-support tools are shipped against the following disclaimer:
"Developmental product is intended for internal evaluation purposes."
Production devices and TMDS development-support tools have been characterized fully, and the quality and
reliability of the device have been demonstrated fully. TI's standard warranty applies.
Predictions show that prototype devices (X or P) have a greater failure rate than the standard production
devices. Texas Instruments recommends that these devices not be used in any production system because their
expected end-use failure rate still is undefined. Only qualified production devices are to be used.
TI device nomenclature also includes a suffix with the device family name. This suffix indicates the package type
(for example, PN) and temperature range (for example, S).
For device part numbers and further ordering information, see the TI website (www.ti.com) or contact your TI
sales representative.
For additional description of the device nomenclature markings on the die, see the TMS320F28002x Real-Time
MCUs Silicon Errata.
PACKAGE TYPE
80-Pin PN Low-Profile Quad Flatpack (LQFP)
64-Pin PM LQFP
48-Pin PT LQFP
DEVICE
280025 280025C
280023 280023C
280021
A. Prefix X is used in orderable part numbers.
10.3 Markings
Figure 10-2 and Figure 10-3 show the package symbolization. Table 10-1 lists the silicon revision codes.
F280025CPMS F280025CPNS
$$#−YMLLLLS $$#−YMLLLLS
G4 G4
Package Package
Pin 1 Pin 1
Package
Pin 1
10.7 Trademarks
C2000™, TMS320C2000™, InstaSPIN-FOC™, Code Composer Studio™, TMS320™, LaunchPad™,
BoosterPack™, TI E2E™ are trademarks of Texas Instruments.
Bosch® is a registered trademark of Robert Bosch GmbH Corporation.
All trademarks are the property of their respective owners.
10.8 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
10.9 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
www.ti.com 29-Jan-2021
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
F280021PTQR ACTIVE LQFP PT 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280021
PTQ
F280021PTSR ACTIVE LQFP PT 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280021
PTS
F280023CPMSR ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280023CPMS
F280023CPNSR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280023CPNS
F280023CPTSR ACTIVE LQFP PT 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280023C
PTS
F280023PMQR ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280023PMQ
F280023PMSR ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280023PMS
F280023PNQR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280023PNQ
F280023PNSR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280023PNS
F280023PTQR ACTIVE LQFP PT 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280023
PTQ
F280023PTSR ACTIVE LQFP PT 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280023
PTS
F280025CPMQR ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025CPMQ
F280025CPMS ACTIVE LQFP PM 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025CPMS
F280025CPMSR ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025CPMS
F280025CPNQR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025CPNQ
F280025CPNSR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025CPNS
F280025CPTQR ACTIVE LQFP PT 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025C
PTQ
F280025CPTSR ACTIVE LQFP PT 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025C
PTS
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 29-Jan-2021
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
F280025PMQR ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025PMQ
F280025PMS ACTIVE LQFP PM 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025PMS
F280025PMSR ACTIVE LQFP PM 64 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025PMS
F280025PNQR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025PNQ
F280025PNS ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025PNS
F280025PNSR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025PNS
F280025PTQR ACTIVE LQFP PT 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025
PTQ
F280025PTS ACTIVE LQFP PT 48 250 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025
PTS
F280025PTSR ACTIVE LQFP PT 48 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F280025
PTS
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
Addendum-Page 2
PACKAGE OPTION ADDENDUM
www.ti.com 29-Jan-2021
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 3
PACKAGE MATERIALS INFORMATION
www.ti.com 2-Jul-2021
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 2-Jul-2021
Pack Materials-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 2-Jul-2021
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
F280025CPMSR LQFP PM 64 1000 336.6 336.6 41.3
F280025CPNQR LQFP PN 80 1000 367.0 367.0 55.0
F280025CPNSR LQFP PN 80 1000 367.0 367.0 55.0
F280025CPTQR LQFP PT 48 1000 336.6 336.6 31.8
F280025CPTSR LQFP PT 48 1000 336.6 336.6 31.8
F280025PMQR LQFP PM 64 1000 336.6 336.6 41.3
F280025PMSR LQFP PM 64 1000 336.6 336.6 41.3
F280025PNQR LQFP PN 80 1000 367.0 367.0 55.0
F280025PNSR LQFP PN 80 1000 367.0 367.0 55.0
F280025PTQR LQFP PT 48 1000 336.6 336.6 31.8
F280025PTSR LQFP PT 48 1000 336.6 336.6 31.8
Pack Materials-Page 3
MECHANICAL DATA
0,27
0,50 0,08 M
0,17
36 25
37 24
48 13
0,13 NOM
1 12
5,50 TYP
7,20
SQ
6,80 Gage Plane
9,20
SQ
8,80
0,25
1,45 0,05 MIN 0°– 7°
1,35
0,75
Seating Plane 0,45
4040052 / C 11/96
0,27
0,50 0,08 M
0,17
60 41
61 40
0,13 NOM
80 21
1 20 Gage Plane
9,50 TYP
12,20 0,25
SQ
11,80 0,05 MIN 0°– 7°
14,20
SQ
13,80
1,45 0,75
1,35 0,45
Seating Plane
4040135 / B 11/96
10.2
B
9.8
NOTE 3
64 49
PIN 1 ID
1 48
10.2 12.2
TYP
9.8 11.8
NOTE 3
16 33
17 32
A
0.27
60X 0.5 64X
0.17
4X 7.5 0.08 C A B
C
(0.13) TYP
SEATING PLANE
0.08
SEE DETAIL A
TYPICAL
4215162/A 03/2017
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. Reference JEDEC registration MS-026.
www.ti.com
EXAMPLE BOARD LAYOUT
PM0064A LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
SYMM
64 49
64X (1.5)
1
48
64X (0.3)
SYMM
60X (0.5) (11.4)
(R0.05) TYP
16 33
17 32
(11.4)
0.05 MAX
EXPOSED METAL ALL AROUND EXPOSED METAL 0.05 MIN
ALL AROUND
4215162/A 03/2017
NOTES: (continued)
www.ti.com
EXAMPLE STENCIL DESIGN
PM0064A LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
SYMM
64 49
64X (1.5)
1
48
64X (0.3)
SYMM
(R0.05) TYP
16 33
17 32
(11.4)
4215162/A 03/2017
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
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